Hole Misalignment and Gain Performance of Gaseous Electron Multipliers
Erik Brücken,
Jouni Heino,
Timo Hildén
et al.
Abstract:It is well known and has been shown that the gain performance of Gaseous Electron Multipliers (GEM) depends on the size of the holes. With an optical scanner it is possible to measure the dimensions of the holes, and to predict the performance of GEMs. However, the gain prediction of GEMs that are manufactured with a double mask etching technique is not straightforward. With the hole size information alone, it is not possible to make precise prediction of the gain. We show that the alignment of the photo-masks… Show more
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