2005
DOI: 10.1088/0953-2048/18/10/010
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Highly homogeneous MgB2films prepared by a new post-annealing process

Abstract: Nanocrystalline MgB2 thin films were prepared on r-cut Al2O3 substrates by annealing of multilayer B/Mg precursors in a flow of Mg vapour. The films are highly homogeneous and show a smooth morphology at both the mesoscale and the microscale. The films exhibit a superconducting transition at Tc∼ 35 K with a transition width of ∼1.2 K and a critical current density at 10 K in the self-field of Jc∼1 × 107 A cm−2.

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Cited by 17 publications
(15 citation statements)
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“…The MgB 2 films were grown by sequential deposition of magnesium and boron layers using a conventional electron beam evaporation and a subsequent annealing process [15,16]. The films selected for this study had a lateral size of 5 5 mm 2 , a thickness of 200 nm, and the critical temperature of 35 K [17].…”
mentioning
confidence: 99%
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“…The MgB 2 films were grown by sequential deposition of magnesium and boron layers using a conventional electron beam evaporation and a subsequent annealing process [15,16]. The films selected for this study had a lateral size of 5 5 mm 2 , a thickness of 200 nm, and the critical temperature of 35 K [17].…”
mentioning
confidence: 99%
“…Shown in the graph is the result of x-ray diffraction measurements obtained from surface reflection of a substrate mounted parallel to the φ-axis of a 4-circle diffractometer. The deviation θ of the direction of the The MgB 2 films were grown by sequential deposition of magnesium and boron layers using a conventional electron beam evaporation and a subsequent annealing process [15,16]. The films selected for this study had a lateral size of 5 × 5 mm 2 and a thickness of 200 nm.…”
mentioning
confidence: 99%
“…10,11 These films with a lateral size of 5 ϫ 5 mm 2 and a thickness of 100-200 nm are partly covered with 1 m of gold by a standard thermal evaporation technique using metal masks. The main goal was the creation of borders between covered and noncovered regions with different angles of incidence of the propagating avalanches.…”
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confidence: 99%
“…Fitting the data has been done using Eq. (6). The resulting parameters are m 0 = 0.11942 emu, t 0 = 3.38 s and n = 160, respectively.…”
Section: Introductionmentioning
confidence: 99%
“…For details see Refs. [6,7]. These films are approximately 300 nm thick and have lateral dimensions of 5 Â 5 mm 2 .…”
mentioning
confidence: 99%