2012
DOI: 10.1039/c2ra21618c
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Highly conducting phosphorous doped n-type nc-Si:H films by HW-CVD for c-Si heterojunction solar cells

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Cited by 6 publications
(9 citation statements)
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“…Therefore, it is concluded that both X C and crystallite size were reduced when the dopant was introduced in the Si films. These results agree with amorphization in the doped Si network due to the local deformation caused by dopant atoms …”
Section: Resultssupporting
confidence: 87%
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“…Therefore, it is concluded that both X C and crystallite size were reduced when the dopant was introduced in the Si films. These results agree with amorphization in the doped Si network due to the local deformation caused by dopant atoms …”
Section: Resultssupporting
confidence: 87%
“…Generally, the doping efficiency of Si films prepared by HWCVD is about 10–20%; in contrast, a higher doping efficiency (10–50%) can be obtained for Si films synthesized by PECVD . Si film with a crystalline phase exhibits higher doping efficiency compared with the amorphous phase, which is also a well-known fact . In our study, the doping efficiency for both doped Si films under the appropriate conditions was >40%, consistent with the trend of X C and with the independence of the two solid doping sources used.…”
Section: Resultssupporting
confidence: 87%
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“…13 The key requirement for high efficiency of heterojunction solar cells is a low amount of recombination at the silicon surfaces, which can be achieved by introducing an intrinsic a-Si:H passivation layer. 14,15 Nolan et al 16 reported interface models of amorphous-crystalline silicon which is generated on Si(100), (110) and (111) surfaces. In particular, they found that the least stable (100) surface will result in the formation of the thickest amorphous silicon layer with the highest density of co-ordination defects, while the most stable (110) surface formed the smallest amorphous region with the least defects.…”
Section: Introductionmentioning
confidence: 99%