Highly charged ion densities and ion confinement properties in an electron-cyclotron-resonance ion source

Electronic temperatures, densities, and plasma x-ray emission of a 14.5 GHz electron-cyclotron resonance ion source

“…The high-energy component has a typical temperature of several tens of keVs [3] while the low-energy component has a much lower value, around 1 keV. Measured temperatures for the high energy electron population range from 5 to 13 keV for an ECRIS operated at 2.45 GHz [6,7], 40-60 keV for a CAPRICE source operated at 10 GHZ [13], and up to 100 keV for an ECRIS operated at 18 and 28 GHz [3,10]. As in the measurements cited above, our study is sensitive to the high-energy electron component due to our detection energy range of ∼ 20 − 120 keV.…”

“…[13]). This distribution can be represented as the sum of two Maxwellian distributions f Mw (E) corresponding to a low-energy and high-energy electron populations, where…”

“…13), depending on the conditions of the plasma. The K (2p → 1s) X-ray spectra of Ar from an ECR ion source was first observed using a cylindrically-bent Johann-type X-ray spectrometer, with a 3.5 eV resolution [13]. A detailed interpretation involving complete calculations with theoretical energies and cross-section values has been published in Refs.…”

“…Results on accurate X-ray spectroscopy, from Ref. [13], combined with Multiconfiguration Dirac-Fock calculations, have led to understand the mechanisms involved in ion formation in the ECRIS plasma [15,16]. In addition, the high-intensity X rays emitted by the highly charged ions in an ECRIS have been proposed as X-ray energy standards [17] together with exotic atoms.…”

“…The electron Bremsstrahlung spectra have been used for measuring electronic temperature in the ECRIS plasma [3][4][5][6][7][8][9][10], and high-resolution X-ray spectroscopy has been applied to characterize charge state distribution and electronic density [11][12][13][14]. Results on accurate X-ray spectroscopy, from Ref.…”