Highly accelerated life testing (HALT) for multilayer ceramic capacitor qualification

Munikoti, R.; Dhar, P.

doi:10.1109/33.16665

Cited by 47 publications

(14 citation statements)

References 2 publications

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“…3 is voltage dependent and is -0.82 eV for the measurements performed at +30V. This value is somewhat smaller than the activation energies reported for bulk MLCs (-1 eV) [6,8]. However, a lower activation energy for degradation has also been observed in other perovskite-type thin fims such as (Ba,Sr)Ti0, [8].…”

Section: A Resistance Degradation and Life-timecontrasting

confidence: 42%

Accelerated life-time testing and resistance degradation of thin-film decoupling capacitors

Alshareef

Dimes²

ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics

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-Resistance degradation in PZT thin-film capacitors has been studied as a function of applied voltage, temperature, and film composition. It is found that the mean-time-to-failure (life-time or $ ) of the capacitors shows a power law dependence on applied voltage of the form $ =V -n (n-4-5). The capacitor life-time also exhibits a temperature dependence of the form tpexp(EJkr), with an activation energy of -0.8 eV. The steady-state leakage current in these samples appears to be bulk controlled. The voltage, temperature, and polarity dependence of the leakage current collectively suggest a leakage current mechanism most similar to a Frenkel-Poole process. The life-time and leakage current of the Nb-doped PZT films are superior to the undoped PZT films. This result can be explained based on the point-defect chemistry of the PZT system. Finally, the results indicate that the Nbdoped PZT films meet the essential requirements for decoupling capacitor applications.

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Section: A Resistance Degradation and Life-timecontrasting

confidence: 42%

Accelerated life-time testing and resistance degradation of thin-film decoupling capacitors

Alshareef

Dimes²

ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics

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“…3 are analyzed by ln (TTF) vs 1/ T (Fig. 4) using an empirical equation developed for the reliability of MLCC as follows 16–18 : where V is the applied voltage, N is the voltage acceleration factor, E a is the apparent activation energy, R is the ideal gas constant, and T is the temperature. Linear relations are observed in Fig.…”

Section: Discussionmentioning

confidence: 99%

Failure Mechanism of a Low‐Temperature‐Cofired Ceramic Capacitor with an Inner Ag Electrode

Shih

Jean

Lin³

2010

Journal of the American Ceramic Society

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Failure mechanism of a multilayer ceramic capacitor (MLCC) made of a low‐fire BaNd2Ti4O12(BNT)+ZnO–B2O3 (ZB) dielectric with an inner pure silver electrode at elevated temperatures and voltages has been investigated. A nonlinear current–voltage leakage characteristic is found when the degradation of MLCC occurs, and the time to failure decreases with increasing either the temperature or the voltage. Results of microstructure, composition, and impedance analyses reveal that the failure is caused by silver diffusion in the ZB glass during sintering and highly accelerated life test.

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“…Thus, when the three items mentioned are considered, the HALT process that shows the optimal efficiency can be determined and can improve the product's reliability. The unique test values and stress steps of the test unit are applied to HALT target products [4]- [7]. The representative terminologies for HALT used in this paper are as follows:…”

Section: Basics Of Haltmentioning

confidence: 99%

Highly accelerated life test of 1.5kW class Low DC-DC converters for hybrid electric vehicles

Kim

Seo³

et al. 2013

2013 International Conference on Electrical Machines and Systems (ICEMS)

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This paper confirms the operational limit and breakdown threshold of low voltage dc-dc converters (LDCs), which are a key component of electric vehicles (xEVs) systems, proposes a highly accelerated life test (HALT) method for predicting the operational lifetime of LDC, and analyzes the experimental results. HALT is the most effective test process for predicting the operational limit and breakdown threshold of products. Especially, for vehicle component HALT, the operational environment and product characteristics must be understood and the test method should be designed. Although LDC is a brand new key component for xEVs, designing the rational test process remains difficult since there are only a few research cases. In this paper, HALT has been implemented to take account of the electrical performance and operational characteristics under the real development process of an LDC. The prototypes are 1.5 kW class LDCs which are applied to the HEV in mass production, and the test has been carried out considering the condition of real vehicle installation and operational conditions. Through the test results, the upper operating limit (UOL) and lower operating limit (LOL) are identified, and the electrical mechanism which generates the operational limit is analyzed.

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Highly accelerated life testing (HALT) for multilayer ceramic capacitor qualification

Cited by 47 publications

References 2 publications

Accelerated life-time testing and resistance degradation of thin-film decoupling capacitors

Accelerated life-time testing and resistance degradation of thin-film decoupling capacitors

Failure Mechanism of a Low‐Temperature‐Cofired Ceramic Capacitor with an Inner Ag Electrode

Highly accelerated life test of 1.5kW class Low DC-DC converters for hybrid electric vehicles

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