2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/ 2015
DOI: 10.1109/iitc-mam.2015.7325655
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High-voltage monolithic 3D capacitors based on through-silicon-via technology

Abstract: Keywords- A. Fabrication approachΩcm are utilized. After removal of the oxide on the 253 978-1-4673-7356-2/15/$31.00 ©2015 IEEE

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