2023
DOI: 10.1021/acsnano.3c04774
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High-Throughput Search for Triplet Point Defects with Narrow Emission Lines in 2D Materials

Sajid Ali,
Fredrik Andreas Nilsson,
Simone Manti
et al.

Abstract: We employ a first-principles computational workflow to screen for optically accessible, high-spin point defects in wide band gap, two-dimensional (2D) crystals. Starting from an initial set of 5388 point defects, comprising both native and extrinsic, single and double defects in ten previously synthesized 2D host materials, we identify 596 defects with a triplet ground state. For these defects, we calculate the defect formation energy, hyperfine (HF) coupling, and zero-field splitting (ZFS) tensors. For 39 tri… Show more

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Cited by 4 publications
(4 citation statements)
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“…More recently, the approach has been applied in density functional calculations of a large set of Rydberg excited states of molecules using GGA, meta-GGA as well as self-interaction-corrected functionals . DO has also been used in the calculations of excited states of solid-state systems with quantum point defects. …”
Section: Introductionmentioning
confidence: 99%
“…More recently, the approach has been applied in density functional calculations of a large set of Rydberg excited states of molecules using GGA, meta-GGA as well as self-interaction-corrected functionals . DO has also been used in the calculations of excited states of solid-state systems with quantum point defects. …”
Section: Introductionmentioning
confidence: 99%
“…44−46 However, some databases contain both TMD-and hBN-based quantum emitters and use the same functional for all materials. 42,44,46 This results in an overall comprehensive database but not all functionals might be equally good for all materials. In contrast, there are also exclusive hBN defects databases, 44,46 however, there do not contain the complete optical fingerprint of many hBN defects.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, numerous databases have vastly been developed to collect properties of a large number of defects in 2D materials. These include machine-learning-based databases and DFT-based databases. The former can handle a large number of data sets but the prediction of promising candidates still requires a DFT calculation for confirmation. In general, a machine-learned database is sufficient for predicting promising new defects that one could fabricate but for defect identification one needs the most accurate data.…”
Section: Introductionmentioning
confidence: 99%
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