2011
DOI: 10.1107/s0909049510047370
|View full text |Cite
|
Sign up to set email alerts
|

High-throughput full-automatic synchrotron-based tomographic microscopy

Abstract: At the TOMCAT (TOmographic Microscopy and Coherent rAdiology experimenTs) beamline of the Swiss Light Source with an energy range of 8-45 keV and voxel size from 0.37 mm to 7.4 mm, full tomographic datasets are typically acquired in 5 to 10 min. To exploit the speed of the system and enable high-throughput studies to be performed in a fully automatic manner, a package of automation tools has been developed. The samples are automatically exchanged, aligned, moved to the correct region of interest, and scanned. … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
27
0

Year Published

2012
2012
2022
2022

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 35 publications
(27 citation statements)
references
References 16 publications
0
27
0
Order By: Relevance
“…Unfortunately, the data set generated by Nordsletten et al (23) does not have the level of resolution required for provision of such information. Nevertheless, generation of high-resolution data is feasible (21), and our current findings provide justification for such studies.…”
Section: Discussionmentioning
confidence: 71%
“…Unfortunately, the data set generated by Nordsletten et al (23) does not have the level of resolution required for provision of such information. Nevertheless, generation of high-resolution data is feasible (21), and our current findings provide justification for such studies.…”
Section: Discussionmentioning
confidence: 71%
“…Fortunately, the methods for 3D-microstructure characterization by means of micro-and nanotomography have significantly improved over the last couple of years, see, e.g. studies based on synchrotron X-ray tomography [13], FIB-tomography [14,15], electron tomography by TEM [16], or 3D analysis with confocal laser scanning microscopy (CLSM) [17]. Since modern imaging techniques can provide reliable 3D-data down to the nanometre scale for nearly all material types, major problems are now related to the processing of the 3D images and to the geometrical definition of the associated microstructure parameters.…”
Section: Introductionmentioning
confidence: 99%
“…To understand particle toughening micromechanisms and capture the region ahead of the crack tip, a ~5 x 5 mm region of interest towards the edge of the damaged region (as determined from C-scans) was cut out to form a 'cube' sample for each material system. To make use of automated sample handling facilities at TOMCAT, these 'cubes' were mounted on standard SEM stubs [33].…”
Section: Srct Scan Proceduresmentioning
confidence: 99%