2011
DOI: 10.1016/j.jallcom.2010.09.150
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High-temperature thermoelectric properties of late rare earth-doped Ca3Co4O9+δ

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Cited by 102 publications
(64 citation statements)
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References 29 publications
(41 reference statements)
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“…However, the previous studies did not show any consistency of the S dependence and different methods were used to interpret different results. The first way is to use the model based on the modified Heikes formula [17,18,20,22,26,41] S ¼ À j B e ln g 3 g 4 …”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…However, the previous studies did not show any consistency of the S dependence and different methods were used to interpret different results. The first way is to use the model based on the modified Heikes formula [17,18,20,22,26,41] S ¼ À j B e ln g 3 g 4 …”
Section: Resultsmentioning
confidence: 99%
“…The substitution can take place either at the Ca-site or at the Co-site. There have been a number of reports on partially substituted elements at Ca-site, for instance, Na [11][12][13][14], Y [8], Ag [15][16][17][18], Bi [12,19], Ba [18], Nd [14], Gd [20], Yb [21], and other rare earth elements [22][23][24]. The effect of partial substitution at the Ca-site is mainly to change the charge carrier concentration which results in a change in resistivity.…”
Section: Introductionmentioning
confidence: 99%
“…The introduction of lanthanide elements, including neodymium (Nd) [152], europium (Eu) [149], holmium (Ho), dysprosium (Dy), erbium (Er) [153], ytterbium (Y) [131] and lutetium (Lu) [153], increases [134,135]. Addition of gadolinium (Gd), dysprosium (Dy), holmium (Ho), and ytterbium (Y) is able to decrease thermal conductivity.…”
Section: P-type Thermoelectric Oxidesmentioning
confidence: 99%
“…[7][8][9][10][11][12][13][14][15][16] 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 The phase purity of the powders and the deposited layers on dense CGO substrate was checked by the X-ray diffraction (XRD) on a BrukerD8 diffractometer with Cu K  radiation. The microstructures of the sintered thick-films were analyzed using a Zeiss Supra 35 scanning electron microscope (SEM) system.…”
Section: Introductionmentioning
confidence: 99%