2010
DOI: 10.4071/hitec-pning-tha13
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High Temperature SiC Power Module Electrical Evaluation Procedure

Abstract: In order to take full advantage of SiC semiconductor devices, high temperature device packaging needs to be developed. The potential defects in design and fabrication procedure are detailed and their detection steps in the electrical evaluation are presented. The established systematic testing procedure can rapidly detect defects and reduce the risk in high temperature packaging testing. The multi-chip module development procedure is also presented and demonstrated with an example.

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Cited by 8 publications
(6 citation statements)
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“…Compared to a silicon (Si) material, Si carbide (SiC) material has higher band gap, greater breakdown field strength and better thermal conducting and thermal stability characteristics [1][2][3][4]. The features give SiC power devices the ability to operate at higher frequency, higher temperature and lower losses among other outstanding performance advantages [5,6].…”
Section: Introductionmentioning
confidence: 99%
“…Compared to a silicon (Si) material, Si carbide (SiC) material has higher band gap, greater breakdown field strength and better thermal conducting and thermal stability characteristics [1][2][3][4]. The features give SiC power devices the ability to operate at higher frequency, higher temperature and lower losses among other outstanding performance advantages [5,6].…”
Section: Introductionmentioning
confidence: 99%
“…As reported in [3] by replacing the Si switches with SiC ones, the switching losses can be significantly reduced. The capability of SiC devices to work at extremely high ambient temperatures make them suitable for many automotive and aerospace applications [74], nevertheless high-temperature consistent device packaging has needed to be suitable for such environments [75] and [76].…”
Section: Introductionmentioning
confidence: 99%
“…To ensure a proper switching behavior the current commutation loops should be short and low inductive. As for high temperature operation, a suitable packaging concept is required for the semiconductor devices in terms of packaging materials as well as module assembly techniques [3].…”
Section: Introductionmentioning
confidence: 99%