1992
DOI: 10.1103/physrevb.46.13104
|View full text |Cite
|
Sign up to set email alerts
|

High-temperature positron diffusion in Si, GaAs, and Ge

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

7
41
1

Year Published

1994
1994
2023
2023

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 73 publications
(50 citation statements)
references
References 62 publications
7
41
1
Order By: Relevance
“…The transmission probability qT for the projectile particles as a function of the distance z can be approximated as Table I. Soininen et al (1992) Nieminen, 1984. "Soininen et al , 1992.…”
Section: Fig 4 Transmission Probabilities For Positrons and Electronsmentioning
confidence: 99%
See 1 more Smart Citation
“…The transmission probability qT for the projectile particles as a function of the distance z can be approximated as Table I. Soininen et al (1992) Nieminen, 1984. "Soininen et al , 1992.…”
Section: Fig 4 Transmission Probabilities For Positrons and Electronsmentioning
confidence: 99%
“…In the Debye approximation (Perkins and Carbotte, 1970;Nieminen and Oliva, 1980;Jensen and Walker, 1990) temperatures. The scattering of positrons by ionized impurities has been studied in the case of phosphorus-doped silicon (Soininen et al , 1992). In this scattering process, a charged impurity causes a long-range Cou1ombic perturbation.…”
mentioning
confidence: 99%
“…L ϩ is ϳ200 nm in GaAs free from positron trapping at defects. 28 The positron lifetime depends mainly on the electron density and provides direct information on the defect size. 8 Therefore, positron lifetime spectroscopy gives additional information on defects in comparison to Doppler broadening which is sensitive to the momentum distribution.…”
Section: B Positron Annihilationmentioning
confidence: 99%
“…This value, however, is believed to be less than the true phonon limited value, due to the effect of shallow trapping that occurs on negatively charged acceptor impurities [6]. Recently Soininen, et al [20] in some of the most accurate and systematic work so far, have measured positron diffusion lengths in GaAs above room temperature (where shallow trapping is not anticipated to be important), and quote a value for D+ of 1.6 _+ 0.2 cm 2 s -1 at 300 K, corresponding to a/~+ value of 62 + 8 cm 2 V -1 s -x. These authors found that the D+ temperature dependence was in accord with the positron scattering from polar optical as well as acoustic phonons as predicted by theory.…”
mentioning
confidence: 93%