2004
DOI: 10.1088/0953-8984/16/37/012
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High-temperature phase transitions in SrBi2Ta2O9film: a study by THz spectroscopy

Abstract: Time-domain THz transmission experiment was performed on SrBi 2 Ta 2 O 9 thick film (deposited on sapphire substrate) at temperatures between 30 and 923 K and complex dielectric spectra of the film were determined. The lowest frequency optic phonon near 28 cm -1 reveals slow monotonous decrease in frequency on heating with no significant anomaly near either the ferroelectric or ferroelastic phase transitions. An additional relaxation mode was resolved in the THz dielectric spectra at all temperatures and its s… Show more

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Cited by 10 publications
(11 citation statements)
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“…Let us stress another feature: The phonon contribution to the permittivity Ј in the ab plane does not exceed 200, while ab Ј ͑1 MHz͒ reaches ϳ2500 at T c . 29 Clearly, the dielectric strength of polar phonons cannot explain the dielectric anomaly near T c in SBN crystal: similarly as in SBT 23 an additional lower frequency excitation ͑probably with a relaxational character͒ is required.…”
Section: Discussionmentioning
confidence: 99%
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“…Let us stress another feature: The phonon contribution to the permittivity Ј in the ab plane does not exceed 200, while ab Ј ͑1 MHz͒ reaches ϳ2500 at T c . 29 Clearly, the dielectric strength of polar phonons cannot explain the dielectric anomaly near T c in SBN crystal: similarly as in SBT 23 an additional lower frequency excitation ͑probably with a relaxational character͒ is required.…”
Section: Discussionmentioning
confidence: 99%
“…An Optistat CF cryostat with thin mylar windows was used for measurements down to 10 K. For sample heating, we used an adapted commercial high-temperature cell ͑SPECAC P/N 5850͒ with 1-mm-thick sapphire windows. 23 The dielectric response of the BBN ceramics was investigated from 10 to 700 K using low-frequency impedance analyzer HP 4192A ͑100 Hz-1 MHz͒ and highfrequency impedance analyzer Agilent 4291B ͑1 MHz-1.8 GHz, 100-500 K͒ with a coaxial measuring cell. The composite dielectric resonator method and network analyzer Agilent E8364B was used at 8.8 GHz and temperatures 100-380 K. 32…”
Section: Methodsmentioning
confidence: 99%
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“…A relaxor behavior has been reported for these ceramics, suggesting a random electric field as the responsible of the observed behavior. The complex dielectric permittivity spectrum in the THz region was studied in SrBi 2 Ta 2 O 9 films (Kadlec et al, 2004). The lowest-frequency optical phonon revealed a slow monotonic decrease in frequency on heating with no significant anomaly near the phase transitions.…”
Section: Bi-layered Ferroelectric Perovskitesmentioning
confidence: 99%