2016
DOI: 10.4071/2016-hitec-242
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High-Temperature Operation of Silicon Carbide CMOS Circuits for Venus Surface Application

Abstract: In the last decade, significant effort has been expended towards the development of reliable, high-temperature integrated circuits. Designs based on a variety of active semiconductor devices including junction field effect transistors and metal-oxide-semiconductor field effect transistors have been pursued and demonstrated. More recently1,2, advances in low-power complementary MOS devices have enabled the development of highly-integrated digital, analog and mixed-signal integrated circuits. The … Show more

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Cited by 11 publications
(3 citation statements)
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“…The long-term performance of solar system exploration instruments necessitates SiC electronics; for example, the parching atmosphere of Venus's surface at 460 • C requires high-temperature electronics [7]. With SiC power electronics, electric power distribution systems can be enhanced.…”
Section: Introductionmentioning
confidence: 99%
“…The long-term performance of solar system exploration instruments necessitates SiC electronics; for example, the parching atmosphere of Venus's surface at 460 • C requires high-temperature electronics [7]. With SiC power electronics, electric power distribution systems can be enhanced.…”
Section: Introductionmentioning
confidence: 99%
“…However, considering the successful pioneering space exploration missions (including landers) launched prior to the 1980's using comparably immature silicon IC technology of the time [15], the simplicity of today's wide bandgap ICs is not actually a major impediment preventing successful engineering of scientifically useful prolonged-mission Venus lander electronics. Arguably, a larger technical barrier to prolonged-mission Venus lander IC feasibility was that stable electrical operation in excess of 1 week has not been reported for the majority of wide bandgap T ≥ 460 • C IC demonstrations conducted to date [16]- [23].…”
Section: Introductionmentioning
confidence: 99%
“…Analog and digital ICs realized in bipolar SiC technology using emitter-coupled logic (ECL) have previously been demonstrated at 500 °C [3]. The MOSFET because of its critical gate oxide, is not an ideal candidate for HT applications, however, CMOS based digital circuits have been reported to work up to 470 °C [4]. The standard Si-CMOS topologies on SiC for the master-slave DFF, and data-reset FF, designed with MESFETs working in the temperature range 25 °C -250 °C are reported in [5].…”
Section: Introductionmentioning
confidence: 99%