1978
DOI: 10.1002/pssa.2210500127
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High-temperature ion implantation in diamond

Abstract: C+ and N+ implantation into type IIa diamond are performed at various temperatures (25 to 1000°C) and ion‐induced damage is studied by EPR measurements at 1.2 to 300 K. Hot implantation at 1000°C results in a reduced spin density of “amorphous” carbon by an order of magnitude less than that due to cold‐implantation and a subsequent annealing at 1000°C. Moreover, hot implantation above 600°C produces two new spin‐1 centers, A‐5 and A‐6, which are tentatively identified as a small multivacancy cluster.

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Cited by 23 publications
(3 citation statements)
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“…39 In the fluence used in our present work, damage cascades could overlap (1 × 10 13 cm −2 ∼ 1/(3 nm) 2 ). So, we employed in-situ annealing in order to prevent excess vacancies from accumulating and thus a high degree of crystallinity was preserved.…”
Section: B Ensemble Measurements Using High Fluence and In-situ Annementioning
confidence: 87%
See 1 more Smart Citation
“…39 In the fluence used in our present work, damage cascades could overlap (1 × 10 13 cm −2 ∼ 1/(3 nm) 2 ). So, we employed in-situ annealing in order to prevent excess vacancies from accumulating and thus a high degree of crystallinity was preserved.…”
Section: B Ensemble Measurements Using High Fluence and In-situ Annementioning
confidence: 87%
“…38 In the case of 1.7 MeV N + implantation (10 16 cm −2 ) into type IIa diamond crystal, the spin density of the EPR signal arising from amorphous carbon after in-situ annealing at 1000 • C was lower by an order of magnitude than ex-situ anneal-ing. 39 In the fluence used in our present work, damage cascades could overlap (1 × 10 13 cm −2 ∼ 1/(3 nm) 2 ). So, we employed in-situ annealing in order to prevent excess vacancies from accumulating and thus a high degree of crystallinity was preserved.…”
Section: B Ensemble Measurements Using High Fluence and In-situ Annea...mentioning
confidence: 87%
“…For the ion-implantation technique the fluences required usually result in graphitization 11,12 , a process that cannot be reversed 13 . Here, we take advantage of (i) high energy implantation to bury the B layer deep inside the diamond where it is subjected to high internal pressures, keeping the lattice intact even under extreme implantation conditions, (ii) high temperature implantation to promote dynamic annealing during the implantation to inhibit graphitization [14][15][16][17] . Residual damage can then be removed by a post implantation annealing step 18 .…”
Section: Introductionmentioning
confidence: 99%