2015
DOI: 10.1016/j.microrel.2014.11.010
|View full text |Cite
|
Sign up to set email alerts
|

High speed test interface module using MEMS technology

Abstract: a b s t r a c t At frequencies above a few gigahertz, testing integrated circuits becomes a challenging task. Test signal integrity degradation due to parasitic effects of interconnects and electromagnetic coupling undermine the test results and increase the yield loss of integrated circuits at high speeds. A new test interface module based on MEMS technology is proposed in this paper. High-speed micro test-channels are designed to establish connectivity between the device under test and the tester at the die … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 30 publications
0
3
0
Order By: Relevance
“…It has also become a serious issue and has become much more difficult to address as a consequence of longer test times, jitter, noise, signal integrity issues, and the usage of expensive instruments [40]. As the data rate grows for transferring data faster, it eventually becomes significant to test and verify these interfaces throughout the development [41]. It is critical and typically takes the majority of the design time.…”
Section: Related Workmentioning
confidence: 99%
“…It has also become a serious issue and has become much more difficult to address as a consequence of longer test times, jitter, noise, signal integrity issues, and the usage of expensive instruments [40]. As the data rate grows for transferring data faster, it eventually becomes significant to test and verify these interfaces throughout the development [41]. It is critical and typically takes the majority of the design time.…”
Section: Related Workmentioning
confidence: 99%
“…The debugging, and testing of these types of interfaces is becoming highly difficult as design complexity rises and the time budget tightens [24]; it and has also been a critical issue due to additional test times, signal integrity problems, and the use of costly instrumentation [25][26][27]. As the requirements for higher data transfer rates grow [28], it is much more critical to test and validate these interfaces during development [29]. However, testing such interfaces usually requires the use of specialized test equipment and software, or it needs to be outsourced to external providers.…”
Section: High-speed Interface Overview and Related Workmentioning
confidence: 99%
“…Overall test principle of automatic test system is shown in figure 2 [4,5,6] . The LabVIEW software and TestStand test management software on PC provide good human-machine interface to the operators,make test process control and processing.…”
Section: The Structure Of the Measured Object And Test Requirement Anmentioning
confidence: 99%