High-Speed Electron Microscopy

Bostanjoglo, O.

doi:10.1007/978-0-387-49762-4_5

Cited by 8 publications

(9 citation statements)

References 154 publications

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“…These electron pulses would therefore be capable of providing 0.4-nm resolution from biomolecules, as in previous XFEL measurements. A pulse duration of 2 ps rather than 100 fs does not change the calculation, so the prediction of King et al [51] appears reasonable in terms of spatial resolution. However, focusing a 100-keV beam (with 10 7 electrons per pulse) down to 100-nm diameter implies a current of 0.8 A and current density of 8,000 MA/cm 2 , which appears unattainable (see Figure 3a).…”

Section: Using Longer Pulses For Electronsmentioning

confidence: 75%

“…Even so, pulsed electron beams are attractive because of their ability to provide time resolution in both repetitive (stroboscopic) and non-repetitive (single-shot) modes, allowing such things as 'molecular movies' and the study of phase transitions [43,51]. Incoherent contrast will suffice for many of these applications, and single-pulse dark-field images with subnanometer resolution may be possible with an RF gun source and aberration-corrected lenses [43].…”

Section: Discussionmentioning

confidence: 99%

“…However, King et al [51] have reported hydrodynamic simulations that predict an image resolution of 0.4 nm within a 10-nm molecule, for 2-ps pulses containing ten million 100-keV electrons focused to 100-nm diameter. The ability to use longer (ps or ns) pulses would make electrons more feasible for serial crystallography.…”

Section: Using Longer Pulses For Electronsmentioning

confidence: 99%

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Outrun radiation damage with electrons?

Egerton

2015

Adv Struct Chem Imag

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The diffract-before-destroy method, using 50-to 100-fs x-ray pulses from a free-electron laser, was designed to determine the three-dimensional structure of biological macromolecules in close to their natural state. Here we explore the possibility of using short electron pulses for the same purpose and the related question of whether radiation damage can be outrun with electrons. Major problems include Coulomb repulsion within the incident beam and the need for high lateral coherence, difficulties that are discussed in terms of existing and future electron sources. Using longer pulses of electrons appears to make the attainment of near-atomic resolution more feasible, at least for nanocrystalline particles, whereas obtaining this information from single-molecule particles in an aqueous environment seems a more distant goal. We also consider the possibility of serial crystallography using a liquid jet injector with a continuous electron beam in a transmission electron microscope (TEM).

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Section: Using Longer Pulses For Electronsmentioning

confidence: 75%

Section: Discussionmentioning

confidence: 99%

Section: Using Longer Pulses For Electronsmentioning

confidence: 99%

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Outrun radiation damage with electrons?

Egerton

2015

Adv Struct Chem Imag

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“…Existing pulse compression techniques for accelerator-based relativistic electron bunches include a-magnets 17 and chicanes, 18,19 usually working in conjunction with RF-cavity electron sources. 20 These time-independent compression techniques have reached the femtosecond domain. Additionally, chicanes have longer flight times for faster electrons as compared to slower electrons.…”

Section: Dispersion Compensation For Attosecond Electron Pulsesmentioning

confidence: 99%

Dispersion compensation for attosecond electron pulses

Hansen¹,

Baumgarten²,

Batelaan³

et al. 2012

Appl. Phys. Lett.

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confidence: 99%

Annular Dark Field Imaging of Catalyst Nanoparticles in Single Shot Dynamic Transmission Electron Microscopy

et al. 2009

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It is currently possible to achieve spatial resolutions of up to 8nm with 15ns electron pulses in Dynamic Transmission Electron Microscopy (DTEM) using high contrast samples such as gold and carbon multilayer films [1]. DTEM has the potential to offer unprecedented insight into the dynamics of catalytic processes, however low signal to background levels and stochastic blur currently limit the achievable single shot spatial resolution in such systems [2]. To approach the 8nm resolution obtained in the gold and carbon multilayer system it would be advantageous to achieve comparable contrast levels for imaging catalyst nanoparticles on low Z substrates [3]. Annular dark field imaging using an annular aperture in the back focal plane of the objective lens is a viable approach to improving the contrast in pulsed electron imaging of catalyst systems [4].Annular apertures with an outer diameter of 264µm and an inner diameter of 137µm were fabricated from 12.5µm thick tantalum foils. In the DTEM at Lawrence Livermore National Laboratory this geometry corresponds to an angle of 20mradians at the edge of the central disc and an angle of 40mradians at the edge of the outer aperture hole. A 1µm layer of aluminum was deposited on the foils to serve as a hard mask. The aluminum hard mask was then patterned by photolithography. The exposed tantalum was subsequently removed using reactive ion etching in sulfur hexafluoride plasma to produce an annular dark field aperture with three support arms.Co 3 O 4 nanoparticles are used to catalyze the growth of silica nanocoils [5]. These particles show relatively low contrast on a carbon support in single shot pulsed imaging, and as such are an ideal catalyst system for testing the efficacy of annular dark field DTEM. The results of initial tests using this system clearly show that annular dark field DTEM vastly enhances both the signal to background ratio and contrast of single shot pulsed electron images.

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High-Speed Electron Microscopy

Cited by 8 publications

References 154 publications

Outrun radiation damage with electrons?

Outrun radiation damage with electrons?

Dispersion compensation for attosecond electron pulses

Annular Dark Field Imaging of Catalyst Nanoparticles in Single Shot Dynamic Transmission Electron Microscopy

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