2017 International Conference of Electronics, Communication and Aerospace Technology (ICECA) 2017
DOI: 10.1109/iceca.2017.8212727
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High speed 8T SRAM cell design with improved read stability at 180nm technology

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Cited by 8 publications
(4 citation statements)
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“…8 Given that the sounds we wish to monitor will probably last for several seconds, there is more than enough power to record the acoustic event. Going further, SRAM bits can be flipped at approximately 10-100 pW of power, 5,10 suggesting that rudimentary computation might be performed to determine if the flash memory bit should be written. Recorded bits might be read later using a passive RFID interrogation system, which can both read the recorded state and reset it.…”
Section: Flip-bit Data Storage and Rf Interrogation Systemmentioning
confidence: 99%
“…8 Given that the sounds we wish to monitor will probably last for several seconds, there is more than enough power to record the acoustic event. Going further, SRAM bits can be flipped at approximately 10-100 pW of power, 5,10 suggesting that rudimentary computation might be performed to determine if the flash memory bit should be written. Recorded bits might be read later using a passive RFID interrogation system, which can both read the recorded state and reset it.…”
Section: Flip-bit Data Storage and Rf Interrogation Systemmentioning
confidence: 99%
“…However, the proposed 8T takes around 0.6ps to reach the 80% of the peak 1V (figure 6). In order to compare the time delay of the proposed model (implemented in 45 nm technology) with the conventional 8T SRAM [18], their model has been redesigned with 45nm technology. The calculated results along with the original results of the reference paper [18] are depicted in table I.…”
Section: Fig4 Time Delay Calculation Between Conventional 8t Sram Amentioning
confidence: 99%
“…In order to compare the time delay of the proposed model (implemented in 45 nm technology) with the conventional 8T SRAM [18], their model has been redesigned with 45nm technology. The calculated results along with the original results of the reference paper [18] are depicted in table I. The proposed 8T SRAM cell with 45nm length demonstrates better performance in terms of time delay for both writing and reading operations.…”
Section: Fig4 Time Delay Calculation Between Conventional 8t Sram Amentioning
confidence: 99%
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