High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam

Tamura, Nobumichi; Padmore, H. A.; Patel, J. R.

doi:10.1016/j.msea.2005.02.033

Cited by 51 publications

(58 citation statements)

References 27 publications

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“…Typically, the microscopic stress and strain have been investigated using X-ray diffraction with microbeam synchrotron radiation. [34][35][36][37][38][39] White X-ray diffraction method with microbeam synchrotron radiation has been also applied to observe the microstructure and to analyze the microscopic stress in steels. 40,41) This method has been employed to analyze the microscopic stresses evolved in the microstructure of iron-based shape memory alloys.…”

Section: Characterization Of Evolution Of Microscopic Stress and Stramentioning

confidence: 99%

“…X-ray energy spectra for several Laue reflection spots were measured using a Ge solid-state detector. 36,37) The lattice spacing of the (hkl) planes, d hkl , was calculated from the measured energy spectra. The lattice strain in the (hkl) planes, ε hkl , was calculated from the change in d hkl with respect to the initial lattice spacing d 0 hkl before deformation.…”

Section: Measurementsmentioning

confidence: 99%

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Characterization of Evolution of Microscopic Stress and Strain in High-Manganese Twinning-Induced Plasticity Steel

et al. 2015

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Section: Characterization Of Evolution Of Microscopic Stress and Stramentioning

confidence: 99%

Section: Measurementsmentioning

confidence: 99%

Characterization of Evolution of Microscopic Stress and Strain in High-Manganese Twinning-Induced Plasticity Steel

et al. 2015

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“…Employing this non-destructive characterization tool that has submicron resolution and microsecond sampling time [21,22], the transformation crystallography of micron-sized zirconia (doped with yttria and titania) was studied in-situ as a function of temperature, providing an in-depth understanding of the characteristic martensitic transformation temperatures as well as monoclinic variant preference during transformation.…”

Section: Introductionmentioning

confidence: 99%

In-situ studies on martensitic transformation and high-temperature shape memory in small volume zirconia

Zeng

Tamura

et al. 2017

Acta Materialia

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Shape memory effect (SME) High temperature deformation High temperature shape memory ceramics a b s t r a c t Recently, the shape memory effect with significant recoverable shape deformation has been discovered in small volume single-crystal zirconia. The application potential for such shape memory ceramics has spurred in-depth exploration of the martensitic transformation crystallography and high temperature shape memory effect. In this work, the martensitic transformation of micron-sized zirconia has been studied in both a pristine as-produced condition and after micromechanical compression, using synchrotron scanning micro X-ray diffraction (mXRD). The pristine zirconia was found to transform into the monoclinic phase via a different crystallographic path than the compressed zirconia, resulting in distinct monoclinic variant preferences. The characteristic martensitic transformation temperatures were also found to be higher after uniaxial compression than in the pristine condition. Such observations provide insight on the differences between stress-induced and thermally-induced martensitic transformation. Moreover, we have observed a full cycle of the shape memory effect with large recoverable strain (7%) in micron-sized zirconia at a temperature of 400 C. Our findings provide an important guideline to tailor the high-temperature shape memory properties of zirconia for further scientific research and engineering applications.

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“…Weak silicon diffraction peaks can be detected and indexed by the adaptive indexing by digitally removing all the peaks indexed as copper and from the remaining, XMAS will index as silicon peaks. The experimental setup in the beamline 12.3.2 provides the capabilities to obtain both deviatoric and hydrostatic stress components [25][26][27][28]. The following sections will discuss both the residual stress measurement from the white beam Laue diffraction in detail.…”

Section: Va Handara Et Al Solar Energy Materials and Solar Cells 162mentioning

confidence: 99%

Probing stress and fracture mechanism in encapsulated thin silicon solar cells by synchrotron X-ray microdiffraction

Handara

Radchenko

Tippabhotla

et al. 2017

Solar Energy Materials and Solar Cells

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A B S T R A C TThin ( < 150 µm) silicon solar cell technology is attractive due to the significant cost reduction associated with it. Consequently, fracture mechanisms in the thin silicon solar cells during soldering and lamination need to be fully understood quantitatively in order to enable photovoltaics (PV) systems implementation in both manufacturing and field operations. Synchrotron X-ray Microdiffraction (µSXRD) has proven to be a very effective means to quantitatively probe the mechanical stress which is the driving force of the fracture mechanisms (initiation, propagation, and propensity) in the thin silicon solar cells, especially when they are already encapsulated. In this article, we present the first ever stress examination in encapsulated thin silicon solar cells and show how nominally the same silicon solar cells encapsulated by different polymer encapsulants could have very different residual stresses after the lamination process. It is then not difficult to see how the earlier observation, as reported by Sander et al. (2013) [1], of very different fracture rates within the same silicon solar cells encapsulated by different Ethylene Vinyl Acetate (EVA) materials could come about. The complete second degree tensor components of the residual stress of the silicon solar cells after lamination process are also reported in this paper signifying the full and unique capabilities of the Synchrotron X-Ray Microdiffraction technique not only for measuring residual stress but also for measuring other potential mechanical damage within thin silicon solar cells.

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High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam

Cited by 51 publications

References 27 publications

Characterization of Evolution of Microscopic Stress and Strain in High-Manganese Twinning-Induced Plasticity Steel

Characterization of Evolution of Microscopic Stress and Strain in High-Manganese Twinning-Induced Plasticity Steel

In-situ studies on martensitic transformation and high-temperature shape memory in small volume zirconia

Probing stress and fracture mechanism in encapsulated thin silicon solar cells by synchrotron X-ray microdiffraction

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