High sensitivity optical image processing device based on CdZnTe/ZnTe multiple quantum well structures

Partovi, Afshin; Glass, A. M.; Olson, David H.; Zydzik, G. J.; Short, K. T.; Feldman, R. D.; Austin, R. F.

doi:10.1063/1.106417

Cited by 76 publications

(31 citation statements)

References 11 publications

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“…Over the past decade, cadmium zinc telluride (Cd 1 À x Zn x Te-CZT) single crystals have demonstrated much promise as a material for room-temperature X-ray and gamma-ray detectors, photovoltaic cells, switching devices, and light-emitting diodes [1][2][3][4][5]. The advantage of using CZT-based detectors in gamma-ray devices lies in the material's wide band-gap, high atomic number, and room-temperature operability.…”

Section: Introductionmentioning

confidence: 99%

Pt coldfinger improves quality of Bridgman-grown Cd0.9Zn0.1Te:Bi crystals

Carcélen

Kim

Camarda

et al. 2012

Journal of Crystal Growth

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Section: Introductionmentioning

confidence: 99%

Pt coldfinger improves quality of Bridgman-grown Cd0.9Zn0.1Te:Bi crystals

Carcélen

Kim

Camarda

et al. 2012

Journal of Crystal Growth

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“…It has been investigated for various industrial applications such as far-infrared and radiation detectors [1][2][3], solar cells [4,5], photo refractive devices [6], and so on. However, CZT crystals have faced to some problems for their uses in device fabrication due to its low defect formation energy and Zn segregation problem.…”

Section: Introductionmentioning

confidence: 99%

Synchrotron radiation x-ray absorption fine-structure and Raman studies on CdZnTe ternary alloys

Chen

Feng

et al. 2009

SPIE Proceedings

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The synchrotron radiation (SR) X-ray absorption fine-structure spectroscopy (XAFS) technology has been employed to obtained Zn K-edge absorption spectra for Cd 1−x Zn x Te alloy with x = 0.03, 0.10, 0.20, 0.30, 0.40, 0.50 and 1.00. Their Fourier transform spectra were analyzed, which have shown a bimodal distribution of bond lengths, suggesting distortion of the Te sub-lattice, so that the linear interpolation is true only in an approximate sense. Synthetic CdZnTe crystals can be used for the room temperature-based detection of gamma radiation. The radiation detection properties of CZT crystals vary widely. A common defect found in most high-quality CZT crystals is Te secondary phases, often located along grain boundaries. The secondary phases can be both large inclusions (>50 μm) and smaller precipitates (<50 μm). The Te secondary phases distributed throughout the crystal can cause changes to the detector leakage current, resulting in decreased radiation spectrometer performance. This set of Cd 1-x Zn x Te crystals were also measured by Raman scattering at room temperature. The two observed peaks at about 125 and 145 cm -1 which can be assigned to Te A 1 and E phonon mode, respectively. The induced damage on the crystal surfaces by Raman laser has been discussed. It is suggested that in the case of highly Zn doping CdZnTe crystals, the ZnTe bond were broken by laser exposing and then free Te atoms are migrating to these heated areas which cause Te precipitate. Further, the results of the soft X-ray measurements have been also presented and this part of the experimental data needs to do more penetrating analysis in the future.

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“…It has been investigated for various industrial applications such as far-infrared and radiation detectors [1][2][3], solar cells [4,5], photorefractive devices [6], etc. However, CZT crystal has not been widely used in device fabrication due to its low defect formation energy and Zn segregation problem.…”

Section: Introductionmentioning

confidence: 99%