High-resolution XES and RIXS studies with a von Hamos Bragg crystal spectrometer

Abstract

The high-resolution von Hamos Bragg crystal spectrometer was constructed for the study of K X-ray emission from low-Z elements and L and M X-ray spectra of medium to high Z elements. Recently, this instrument was applied to high-resolution XES and RIXS studies using X-ray synchrotron radiation at the ID21 and BM5 beamlines at the ESRF. An outline of the spectrometer design and performance characteristics will be given. The studies deal with the energy dependent KL double photoexcitation of argon, the L 3 and M 1 atomic-level widths of elements 54 ≤ Z ≤ 77, and the evolution of the K-edge RIXS spectra of manganese oxides.

The evolution of inner-shell multielectronic X-ray spectra from threshold to saturation for low- to high-Z atoms

“…Our research program (Deutsch et al, 1996;Diamant et al, 2000aDiamant et al, , b, 2006Fritsch et al, 1998;Galambosi et al, 2003;Huotari et al, 2004), and those of several other groups worldwide (Dousse et al, this volume;Dunford et al, 2004;Hoszowska and Dousse, 2004;Kawatsura et al, 2003;Kanter et al, 2006;Oura et al, 2002;Shigeoka et al, 2004;Sternemann et al, 2000), have focused over the last few years on the adiabatic, near-threshold region, which has been only little studied to date in any but the lowest-Z atoms (mostly He), and on weak multielectronic atomic excitations like satellites and hypersatellites. Some of the results obtained were discussed above.…”

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

“…The spectrometer geometry allows recording a wide energy range x-ray emission spectrum at a single excitation energy and has found a variety of applications in combination with lab, synchrotron, and XFEL sources. 30,[40][41][42][43][44] Thanks to the dispersive-type of diffraction, the spectrometer geometry provides the possibility of a single-shot measurement with a total energy bandwidth ranging from a few tens to a few hundreds of eV. The development of innovative and compact von Hamos spectrometers has also benefited from the parallel advances of position-sensitive detectors.…”

Laboratory von Hámos X-ray spectroscopy for routine sample characterization

“…The von Hámos geometry, which is used more and more at synchrotrons and X-ray free electron lasers, [14][15][16] has rarely been used in laboratory based hard X-ray spectrometers. The first examples for dispersive-mode laboratory X-ray spectrometers adapted flat single crystals to monochromatize the white X-ray radiation of common sources, 17,18 but the lack of the focusing bending of the von Hámos type analyzers in these cases hampers both count rate and resolution.…”