High resolution wavelength dispersive X-ray spectroscopy for ECR plasma diagnostics

Lehnert, U.; Zippe, C.; Zschornack, G.

doi:10.1007/bf02274926

Cited by 7 publications

(3 citation statements)

References 3 publications

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“…More specifically, interest in studying ECR plasma through radiation in the X-ray range domain has recently risen. The electron Bremsstrahlung spectra have been used for measuring electronic temperature in the ECRIS plasma [3][4][5][6][7][8][9][10], and high-resolution X-ray spectroscopy has been applied to characterize charge state distribution and electronic density [11][12][13][14]. Results on accurate X-ray spectroscopy, from Ref.…”

Section: Introductionmentioning

confidence: 99%

Electronic temperatures, densities, and plasma x-ray emission of a 14.5 GHz electron-cyclotron resonance ion source

Gumberidze

Trassinelli

Adrouche

et al. 2010

Review of Scientific Instruments

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We have performed a systematic study of the Bremsstrahlung emission from the electrons in the plasma of a commercial 14.5 GHz Electron-Cyclotron Resonance Ion Source. The electronic spectral temperature and the product of ionic and electronic densities of the plasma are measured by analyzing the Bremsstrahlung spectra recorded for several rare gases (Ar, Kr, Xe) as a function of the injected power. Within our uncertainty, we find an average temperature of ≈ 48 keV above 100W, with a weak dependency on the injected power and gas composition. Charge state distributions of extracted ion beams have been determined as well, providing a way to disentangle the ionic density from the electronic density. Moreover X-ray emission from highly charged argon ions in the plasma has been observed with a high-resolution mosaic crystal spectrometer, demonstrating the feasibility for high-precision measurements of transition energies of highly charged ions, in particular of the magnetic dipole (M1) transition of He-like of argon ions.

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Section: Introductionmentioning

confidence: 99%

Electronic temperatures, densities, and plasma x-ray emission of a 14.5 GHz electron-cyclotron resonance ion source

Gumberidze

Trassinelli

Adrouche

et al. 2010

Review of Scientific Instruments

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“…Many studies exist in the literature where the continuum bremsstrahlung radiations emitted by the electrons due to collisions in the plasma have been used for characterisation of plasma parameters. [7][8][9][10][11][12][13][14][15][16][17] Similarly, high-resolution studies of characteristic lines of ions in both the x-ray region 13,[17][18][19][20][21][22] and the UV-visible region 23,24 have been used for plasma diagnostics. The applications of spectroscopic techniques to plasma diagnostics has been summarised by Grubling et al 8 The motivation behind this study encompasses many aspects, the first of these being the characterisation of the plasma.…”

Section: Introductionmentioning

confidence: 99%

Temperature diagnostics of ECR plasma by measurement of electron bremsstrahlung

Kasthurirangan

Agnihotri

Desai

et al. 2012

Review of Scientific Instruments

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The x-ray bremsstrahlung spectrum emitted by the electron population in a 14.5 GHz ECR plasma source has been measured using a NaI(Tl) detector, and hence the electron temperature of the higher energy electron population in the plasma has been determined. The x-ray spectra for Ne and Ar gases have been systematically studied as a function of inlet gas pressure from 7 × 10(-7) mbar to 7 × 10(-5) mbar and for input microwave power ∼1 W to ∼300 W. At the highest input power and optimum pressure conditions, the end point bremsstrahlung energies are seen to reach ∼700 keV. The estimated electron temperatures (T(e)) were found to be in the range 20 keV-80 keV. The T(e) is found to be peaking at a pressure of 1 × 10(-5) mbar for both gases. The T(e) is seen to increase with increasing input power in the intermediate power region, i.e., between 100 and 200 W, but shows different behaviour for different gases in the low and high power regions. Both gases show very weak dependence of electron temperature on inlet gas pressure, but the trends in each gas are different.

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“…Alternatively, the CSD inside the plasma may be obtained nonintrusively through the analysis of high-resolution x-ray spectra emitted by the ECRIS [16][17][18][19][20]. In fact, ECRIS are characterized, among other properties, by their capacity to produce x-ray emission, including bremsstrahlung and characteristic lines, which can thus be used for plasma diagnostics.…”

Section: Introductionmentioning

confidence: 99%

X-ray-spectroscopy analysis of electron-cyclotron-resonance ion-source plasmas

et al. 2010

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Analysis of x-ray spectra emitted by highly charged ions in an electron-cyclotron-resonance ion source (ECRIS) may be used as a tool to estimate the charge-state distribution (CSD) in the source plasma. For that purpose, knowledge of the electron energy distribution in the plasma, as well as the most important processes leading to the creation and de-excitation of ionic excited states are needed. In this work we present a method to estimate the ion CSD in an ECRIS through the analysis of the x-ray spectra emitted by the plasma. The method is applied to the analysis of a sulfur ECRIS plasma.

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High resolution wavelength dispersive X-ray spectroscopy for ECR plasma diagnostics

Cited by 7 publications

References 3 publications

Electronic temperatures, densities, and plasma x-ray emission of a 14.5 GHz electron-cyclotron resonance ion source

Electronic temperatures, densities, and plasma x-ray emission of a 14.5 GHz electron-cyclotron resonance ion source

Temperature diagnostics of ECR plasma by measurement of electron bremsstrahlung

X-ray-spectroscopy analysis of electron-cyclotron-resonance ion-source plasmas

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