High resolution transmission electron microscopy studies of metal/ceramics interfaces

Ikuhara, Yuichi; Pirouz, Pirouz

doi:10.1002/(sici)1097-0029(19980201)40:3<206::aid-jemt4>3.0.co;2-s

Cited by 73 publications

(46 citation statements)

References 89 publications

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“…As can be observed in the asymmetric scan corresponding to the MgO͑111͒ diffraction peak, the MgO substrates display the expected fourfold symmetry. As previously reported, 6,[8][9][10] V grown on MgO͑100͒ also displays a fourfold symmetry with an additional rotation of 45°, leading to the V͑001͒ bcc ͓100͔ ʈ MgO͑001͓͒110͔ epitaxial relation, i.e., a 45°i n-plane rotation of the V͓100͔ directions with respect to the MgO ones. On the other hand, it can be observed that the fcc Co grown on MgO͑100͒ shows a well defined fourfold symmetry that corresponds to the following epitaxial relationship Co͑001͒ fcc ͓100͔ ʈ MgO͑001͓͒100͔ similar to the one reported for the growth of Co on MgO͑100͒ at 250°C.…”

Section: A X-ray Diffractionsupporting

confidence: 69%

Structural and magnetic properties of V∕Cofcc and Cohcp∕V bilayers grown on MgO(100): A comparative study

Calleja

Huttel

Contreras

et al. 2006

Journal of Applied Physics

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Structural and magnetic properties of planar nanowire arrays of Co grown on oxidized vicinal silicon (111) A detailed study of the structure and magnetic properties of V / Co versus Co/ V bilayers grown on MgO͑001͒ substrates with cubic and hexagonal Co crystal structures is presented. Co is found to adopt fcc structure when grown on MgO͑001͒, while it adopts hcp structure when grown on V͑001͒. The different magnetocrystalline anisotropy associated with each structure gives rise to different magnetic properties for the otherwise equivalent symmetric Co-V bilayers.

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Section: A X-ray Diffractionsupporting

confidence: 69%

Structural and magnetic properties of V∕Cofcc and Cohcp∕V bilayers grown on MgO(100): A comparative study

Calleja

Huttel

Contreras

et al. 2006

Journal of Applied Physics

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“…In the previous study by Ikuhara and Pirouz, the CRLP calculation was applied to V/Al 2 O 3 interfaces, 18,19) and the calculated OR with highest coherency was found to be consistent with the experimental one. 20,21) Therefore, this calculation may be able to predict the most coherent OR between two different crystals. In this method, the overlap of reciprocal lattice points of two adjoining crystals was considered in order to obtain the geometrically optimum OR between the two crystals.…”

Section: Geometrical Coherencymentioning

confidence: 99%

Atomic and Electronic Structures of Ni/YSZ(111) Interface

et al. 2004

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Thin Ni films were deposited on the (111) surface of YSZ at 1073 K by a pulsed laser deposition technique. The interfacial atomic structure of Ni/YSZ was investigated by high-resolution transmission electron microscopy (HRTEM). It was found that Ni was epitaxially oriented to the YSZ surface, and the following orientation relationship (OR) was observed: ð111Þ Ni k ð111Þ YSZ , ½1 1 10 Ni k ½1 1 10 YSZ . Geometrical coherency of the Ni/YSZ system was also evaluated by the coincidence of reciprocal lattice points (CRLP) method. It was found that the most coherent OR predicted by CRLP method was ð705Þ Ni k ð111Þ YSZ , ½0 1 10 Ni k ½1 1 10 YSZ , which was not consistent with the experimentally observed OR. To understand the detailed atomic structure, HRTEM image simulations were performed. However, simulated images based on both O-terminated and Zr-terminated interface models were quite similar to the experimental image, and thus it was hard to determine which model is comparable with the actual interface only by the HRTEM image simulations. In order to clarify the termination layer at the interface, electronic structures of the Ni/YSZ interface were investigated by electron energy-loss spectroscopy. It was found that significant differences were observed in O-K edge spectra between the interface and the YSZ crystal interior, and the spectrum from the interface showed similar features to the reference spectrum of bulk NiO. This indicates that the Ni-O interaction occurs at the interface to terminate the oxygen {111} plane of YSZ at the Ni/YSZ interface. In addition, the density of Ni-O bonds across the interface in the experimental OR was larger than that in the most coherent OR predicted by CRLP method, which also suggests that the on-top Ni-O bonds stabilize the Ni/YSZ(111) interface.

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“…Reprinted with permission from [22]. © 2017 AIP misfit dislocations, it is possible to calculate the spacing between dislocations (d) from d = b ̸ δ, where b is the Burgers vector and δ is the lattice mismatch between thin film and substrate [25]. Using the lattice parameters obtained from XRD [δ = ðq x sub − q x film Þ ̸ q x film = + 0.0435], the estimated dislocation spacing is 8.7 nm, suggesting that the dislocations fully relax the strain in the film.…”

Section: Pulsed Laser Depositionmentioning

confidence: 99%

Fabrication, Characterization, and Modulation of Functional Nanolayers

Ohta

Hiramatsu

2018

Nanoinformatics

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Regions of a few nanometers at the surface or interface of a material exhibit various functional properties, which differ from those of the bulk because the electrons and/or ions receive different potentials due to the incoherent atomic arrangement. High-quality epitaxial films of functional materials called "nanolayers" are important to utilize such functional properties. However, fabrication of high-quality nanolayers of complex materials with complicated crystal structures is usually challenging due to the difference in the thermochemical properties of the constituents. In this chapter, epitaxial growth techniques, especially "reactive solid-phase epitaxy" of functional oxides and chalcogenides, are reviewed based on the authors' efforts. Additionally, this chapter reviews several modulation methods of optical, electrical, and magnetic properties of functional oxide nanolayers.

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High resolution transmission electron microscopy studies of metal/ceramics interfaces

Cited by 73 publications

References 89 publications

Structural and magnetic properties of V∕Cofcc and Cohcp∕V bilayers grown on MgO(100): A comparative study

Structural and magnetic properties of V∕Cofcc and Cohcp∕V bilayers grown on MgO(100): A comparative study

Atomic and Electronic Structures of Ni/YSZ(111) Interface

Fabrication, Characterization, and Modulation of Functional Nanolayers

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