We have studied the self-heating of a large stack of Bi 2 Sr 2 CaCu 2 O 8+δ intrinsic Josephson junctions, of a configuration designed for THz generation. We find good qualitative agreement between direct thermoluminescent measurements of the device surface temperature and low-temperature scanning laser microscopy images. In particular, the two techniques both reveal a novel mode of thermal instability through the asymmetric nucleation of a small hot-spot near a corner/edge of the sample. This behavior conforms with a theoretical stability analysis, and the radius of the hot-spot is in excellent agreement with theoretical predictions, as is its growth with increasing bias current and bath temperature. Narrow hot-spots may offer a new possible means of enhancing the terahertz emission power from this type of device.