High-Resolution Single-Grain Diffraction of Polycrystalline Materials

Lienert, U.; Ribárik, Gabor; Ungár, Tamás; Wejdemann, Christian; Pantleon, Wolfgang

doi:10.1080/08940886.2017.1316130

Cited by 6 publications

(5 citation statements)

References 42 publications

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“…These intensity variations can be interpreted using an intragranular orientation distribution function employing methods analogous to quantitative texture analysis (31,32). Higher-angular-resolution analogs to ff-HEDM have been developed to measure these distributions to very high resolution (37)(38)(39)(40)(41). Note, however, that ff-HEDM and its higher-angular-resolution analogs do not provide any spatial information for these intragranular fields.…”

Section: Bragg Peak Intensity Modulationmentioning

confidence: 99%

High-Energy X-Ray Diffraction Microscopy in Materials Science

Bernier

Suter

Rollett

et al. 2020

Annu. Rev. Mater. Res.

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High-energy diffraction microscopy (HEDM) is an implementation of three-dimensional X-ray diffraction microscopy. HEDM yields maps of internal crystal orientation fields, strain states, grain shapes and locations as well as intragranular orientation distributions, and grain boundary character. Because it is nondestructive in hard materials, notably metals and ceramics, HEDM has been used to study responses of these materials to external fields including high temperature and mechanical loading. Currently available sources and detectors lead to a spatial resolution of ∼1 μm and an orientation resolution of <0.1○. With the penetration characteristic of high energies ( E ≥ 50 keV), sample cross-section dimensions of ∼1 mm can be studied in materials containing elements across much of the Periodic Table. This review describes hardware and software associated with HEDM as well as examples of applications. These applications include studies of grain growth, recrystallization, texture development, orientation gradients, deformation twinning, annealing twinning, plastic deformation, and additive manufacturing. We also describe relationships to other X-ray-based methods as well as prospects for further development.

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Section: Bragg Peak Intensity Modulationmentioning

confidence: 99%

High-Energy X-Ray Diffraction Microscopy in Materials Science

Bernier

Suter

Rollett

et al. 2020

Annu. Rev. Mater. Res.

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“…However, it is well‐known from classical metallography that the 2D characterization of materials microstructures by 2D sections yields only limited information on the true 3D size and morphology of the grains. And while much effort has been put on the 3D experimental investigation of polycrystalline materials in recent years, they are still treated commonly as 2D objects in numerical and analytical investigations . Of course, this may very well be realistic in some materials, but it cannot be assumed to be true in general.…”

Section: Introductionmentioning

confidence: 99%

Texture Controlled Grain Growth in Thin Films Studied by 3D Potts Model

Zöllner

2019

Advcd Theory and Sims

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Thin films have numerous applications in optics, mechanics, and electricity, where the grain microstructure and the corresponding crystallography are key factors influencing materials properties as well as coarsening kinetics. However, even today this problem is often tackled by 2D means of treating thin films as quasi-2D objects. In the present work, it is shown by modified 3D Potts model simulations that not only is the third dimension non-negligible, but also how texture changes the growth kinetics, when the percentage of low angle grain boundaries varies systematically.

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“…The FWHM decreases rapidly with increasing crystal size and approaches zero asymptotically. For a moderately high reciprocal resolution in experiments, Áq=q ' 10 À3 (Lienert et al, 2017). The corresponding Áq values are 4:8 Â 10 À4 , 5:5 Â 10 À4 and 9:1 Â 10 À4 Å À1 for (1 " 1 11), (002) and (1 " 1 13), respectively.…”

Section: Crystal Size Effect On Node-broadening In Reciprocal Spacementioning

confidence: 99%

GAPD: a GPU-accelerated atom-based polychromatic diffraction simulation code

Wang

Chen

Zhang

et al. 2018

J Synchrotron Radiat

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GAPD, a graphics-processing-unit (GPU)-accelerated atom-based polychromatic diffraction simulation code for direct, kinematics-based, simulations of X-ray/electron diffraction of large-scale atomic systems with mono-/polychromatic beams and arbitrary plane detector geometries, is presented. This code implements GPU parallel computation via both real- and reciprocal-space decompositions. With GAPD, direct simulations are performed of the reciprocal lattice node of ultralarge systems (∼5 billion atoms) and diffraction patterns of single-crystal and polycrystalline configurations with mono- and polychromatic X-ray beams (including synchrotron undulator sources), and validation, benchmark and application cases are presented.

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High-Resolution Single-Grain Diffraction of Polycrystalline Materials

Cited by 6 publications

References 42 publications

High-Energy X-Ray Diffraction Microscopy in Materials Science

High-Energy X-Ray Diffraction Microscopy in Materials Science

Texture Controlled Grain Growth in Thin Films Studied by 3D Potts Model

GAPD: a GPU-accelerated atom-based polychromatic diffraction simulation code

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