High resolution images of a reconstructed surface structure on (111) gold platelets: Interpretation and comparison with theoretical models

Nihoul, G.; Abdelmoula, K.; Métois, J.J.

doi:10.1016/0304-3991(83)90249-8

Cited by 37 publications

(8 citation statements)

References 8 publications

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“…Also on our spherical crystals of gold the well known structure (001)(5x20) was observed before we used the cleaning of Au by premelting it in air [15]. These crystals have shown also the known structure (110)( 1 x 2) and the new ones (11 l)(23x 1), (227)(1 x 1), (551)(1 x 1) and reconstructions on (001) vicinal planes [15], Later on the new structure (lll)(23xl) was confirmed by several authors on differently prepared specimens with different methods, as reported recently [16], Surprisingly the oxygen-cleaned Au crystals show only the naive structures (001 )(1 x 1) of Fig. 5 and (111)(1 X 1) [17], These results were confirmed on 5 crystals after melting in air only and on 8 crystals after premelting in air and remelting in UHV.…”

Section: Electron Diffraction: Surface Reconstructionssupporting

confidence: 74%

Surface Analysis and Structures Spherical Crystals of Very Clean Au, Cu and Au-Cu Alloys Grown from a Drop of Melt

Grosser

Menzel

1985

Zeitschrift Für Naturforschung A

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Surface impurities on spherical Au and Cu crystals grown from a drop of melt on graphite in UHV were analyzed by Auger electron spectroscopy after the metals had been cleaned by melting resp. roasting in air. Crystals of Au-Cu alloys grown by the same technique show enrichment of the less abundant component.The well known reconstructions Au(001)(5x20) and Au(l 1 l)(23x 1) could not be detected by RHEED and LEED on cleaned Au crystals. But both structures were confirmed on crystals of Au + 45 at ppm Cu. Au(l 10)(1 x2) was present on cleaned and weakly Cu alloyed Au crystals.

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Section: Electron Diffraction: Surface Reconstructionssupporting

confidence: 74%

Surface Analysis and Structures Spherical Crystals of Very Clean Au, Cu and Au-Cu Alloys Grown from a Drop of Melt

Grosser

Menzel

1985

Zeitschrift Für Naturforschung A

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“…Alternative approaches such as proximal scanning probe methods are invaluable for determining the outermost surface structure but they are rarely sensitive to the bulk registry for a continuous reconstruction. Plan-view high-resolution transmission electron microscopy (HRTEM) has been demonstrated for known surface structures 6 7 8 9 10 11 , but the number of successful applications to unknown surface structures is very small 12 13 . Cross-sectional HRTEM techniques can also provide important information about bulk–surface registration, but cannot account for the possibility of multiple surface domains in the projection of the cross-section.…”

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confidence: 99%

Surface determination through atomically resolved secondary-electron imaging

et al. 2015

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Unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is compatible with faceted nanomaterials, but has not been previously utilized for surface structure determination. Here we report a detailed experimental atomic-resolution secondary-electron microscopy analysis of the c(6 × 2) reconstruction on strontium titanate (001) coupled with careful simulation of secondary-electron images, density functional theory calculations and surface monolayer-sensitive aberration-corrected plan-view high-resolution transmission electron microscopy. Our work reveals several unexpected findings, including an amended registry of the surface on the bulk and strontium atoms with unusual seven-fold coordination within a typically high surface coverage of square pyramidal TiO5 units. Dielectric screening is found to play a critical role in attenuating secondary-electron generation processes from valence orbitals.

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“…Atomic imaging of small particles became relatively easy in the early 1980s, although there were papers such as the elegant work of Tsutomu [229] and surface studies at lower resolution [230][231][232][233][234][235][236][237] much earlier. Profile imaging was discovered in the early 1980s [11,[238][239][240], and was rapidly used and extended by many groups around the world for both profile and plan-view imaging using instruments without aberration correctors (e.g., Refs [235,[241][242][243][244][245][246][247][248][249][250][251][252][253][254][255][256]), see also [257] for other early references. Because those instruments had lanthanum hexaboride sources it was relatively easy to image the surface (as well as the bulk) [258].…”

Section: Discussionmentioning

confidence: 99%