Biological and Medical Sensor Technologies 2017
DOI: 10.1201/b11529-14
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High-Resolution CdTe Detectors and Their Application to Gamma-Ray Imaging

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Cited by 9 publications
(43 citation statements)
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“…The partial pressures of both argon and oxygen in the vacuum chamber during the deposition process were 400 mPa. The magnetron power was~150 W. The deposition process lasted for 10 min at the CdTe substrate temperature of~100 • C. In terms of the practical application of the developed CdTe-based structures for detection of X/γ-ray radiation, it is important to analyze the reverse branches of the I-V characteristics when the Schottky contact is biased positively with respect to the MoO x -Mo ohmic contact because of diode-type detectors operate under reverse bias [4][5][6][7][8]. It should be noted that the reverse currents in the heterostructures under investigation are equal to several nanoamperes at bias voltages of~50-100 V at room temperature (Figure 3).…”
Section: Schottky Contact Formationmentioning
confidence: 99%
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“…The partial pressures of both argon and oxygen in the vacuum chamber during the deposition process were 400 mPa. The magnetron power was~150 W. The deposition process lasted for 10 min at the CdTe substrate temperature of~100 • C. In terms of the practical application of the developed CdTe-based structures for detection of X/γ-ray radiation, it is important to analyze the reverse branches of the I-V characteristics when the Schottky contact is biased positively with respect to the MoO x -Mo ohmic contact because of diode-type detectors operate under reverse bias [4][5][6][7][8]. It should be noted that the reverse currents in the heterostructures under investigation are equal to several nanoamperes at bias voltages of~50-100 V at room temperature (Figure 3).…”
Section: Schottky Contact Formationmentioning
confidence: 99%
“…The I-V characteristics of the In/CdTe/Au diodes, measured in dark conditions at room temperature, showed excellent rectifying properties, especially taking into account the fact that CdTe crystals used for detector fabrication were semi-insulating (Figure 8). In the case of unirradiated In/CdTe/Au samples with just deposited In and Au electrodes (Figure 8a), the rectification was due to a high Schottky barrier at the In/CdTe interface that was typical for an In electrical contact and semi-insulating p-like CdTe and this was widely used for fabrication of Schottky diode detectors [5][6][7][8][9][10]14]. Moreover, the rectification significantly increased after laser irradiation of the In/CdTe structure (Figure 8b,c).…”
Section: Electrical Characteristics Of In/cdte/au Diode Structures Fabricated By Laser Irradiationmentioning
confidence: 99%
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