2015
DOI: 10.1039/c5nr00565e
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High-resolution and large-area nanoparticle arrays using EUV interference lithography

Abstract: Well-defined model systems are needed for better understanding of the relationship between optical, electronic, magnetic, and catalytic properties of nanoparticles and their structure. Chemical synthesis of metal nanoparticles results in large size and shape dispersion and lack of lateral order. In contrast, conventional top-down lithography techniques provide control over the lateral order and dimensions. However, they are either limited in resolution or have low throughput and therefore do not enable the lar… Show more

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Cited by 57 publications
(54 citation statements)
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“…2 and described elsewhere [7]. Briefly, layered thin films of chromium (3 nm), gold (5 nm), and chromium (3 nm) are thermally evaporated on a 3 × 3 mm 2 , 100-nm-thick silicon nitride membrane.…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…2 and described elsewhere [7]. Briefly, layered thin films of chromium (3 nm), gold (5 nm), and chromium (3 nm) are thermally evaporated on a 3 × 3 mm 2 , 100-nm-thick silicon nitride membrane.…”
Section: Methodsmentioning
confidence: 99%
“…This method is suitable for broadband EUV sources, i.e. the majority of EUV sources, and for low intensity or brightness sources, since the aerial image is generated using the interference from all transmitted diffraction orders, allowing large area patterning with high throughput via step-and-repeat exposures [7].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Divergence allows to expose a transmission grating with a membrane size of 2 x 2 mm² homogeneously which defines the size of a single exposure field. Larger areas can be achieved by stitching of fields 18 . Each transmission mask (10 x 10 mm² chip size) is fixed in a separate mask holder and can be reproducibly attached to the mask positioner unit magnetically.…”
Section: Euv Laboratory Exposure Toolmentioning
confidence: 99%
“…As EUV technology undergoes further research and development to prepare it for industrial use, EUV interference lithography (IL) has been used for the research and development of suitable photoresists, since EUV-IL is capable of printing the highest resolution patterns possible using photon based sources [3]. Furthermore, EUV-IL is capable of printing high resolution, highly dense periodic patterns over a large area with high throughput in comparison to other research tools such as e-beam lithgraphy, allowing the fabrication of nanoscale structures for scientific study of, for example, nano-catalysis [4], magnetic frustration [5], metal nanostructures [6], and quasi-crystallinity [7].…”
Section: Introductionmentioning
confidence: 99%