Abstract:Lens‐based x‐ray microscopy and nano‐CT is a relatively new approach for imaging and characterizing nanostructures. To date, tens of nanometer resolution in 2D and 3D is routinely achieved with both commercial laboratory systems and instruments based at synchrotron radiation facilities. The nondestructive nature of the technique makes it particularly well suited for
in situ
studies on dynamic behavior of nanostructures while in or near their real operation conditions. With the use of tu… Show more
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