High reliability, high performance 1300 nm, 1480 nm GaInAsP/InP GRIN-SCH strained-layer quantum well lasers

Kasukawa, A.; Namegaya, T.; Tsukiji, Naoki; Matsumoto, N.; Ikegami, Yoshikazu

doi:10.1109/leos.1994.586308

Cited by 1 publication

(1 citation statement)

References 6 publications

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“…The Furukawa group reported the device lifetime of 1.8 x 10 6 hours under a constant output power operation of 160-180 mW at 25°C, and the activa tion energy was estimated to be 0.63 eV. 51 The failure criterion was defined as an operating current increase of 20% of the initial value. Systematic reliability results for the lasers have been also presented by AT&T Bell laboratories in LEOS'94, and low degradation rate and long lifetime were estimated under constant output power operation.…”

Section: H80 Nm Lasersmentioning

confidence: 99%

Reliability of High Power Pump Lasers for Erbium-Doped Fiber Amplifiers

FUKUDA

1996

Selected Topics in Electronics and Systems

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The degradation behavior and the reliability of 980 nm lasers and 1480 nm lasers are reviewed and discussed. In addition, packaging problems for the high power lasers are also discussed from the application viewpoint. For 980 nm lasers the reliability in laser chip is limited mainly by the instability of an interface between the laser material (facet) and the anti-reflecting coating film, and for most 1480 nm lasers the reliability of the laser chip is determined mainly by the instability of a buried heterointerface. These reliability problems have been solved, however, by examining the material properties and improving device fabrication technology. The main packaging problem is a packaginginduced failure (PIF) causing sudden failure in 980 nm lasers sealed in dry N2 or Ar, but packaging problems have also been suppressed or eliminated. The device technology and packaging technology needed to make high power pump laser modules have been established, and erbium-doped fiber amplifiers pumped by these lasers are indispensable components of many optical transmission systems. 55 Current Trends in Optical Amplifiers and Their Applications Downloaded from www.worldscientific.com by UNIVERSITY OF BIRMINGHAM LIBRARY -INFORMATION SERVICES on 03/21/15. For personal use only. Current Trends in Optical Amplifiers and Their Applications Downloaded from www.worldscientific.com by UNIVERSITY OF BIRMINGHAM LIBRARY -INFORMATION SERVICES on 03/21/15. For personal use only.

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Section: H80 Nm Lasersmentioning

confidence: 99%

Reliability of High Power Pump Lasers for Erbium-Doped Fiber Amplifiers

FUKUDA

1996

Selected Topics in Electronics and Systems

View full text Add to dashboard Cite

show abstract

High reliability, high performance 1300 nm, 1480 nm GaInAsP/InP GRIN-SCH strained-layer quantum well lasers

Cited by 1 publication

References 6 publications

Reliability of High Power Pump Lasers for Erbium-Doped Fiber Amplifiers

Reliability of High Power Pump Lasers for Erbium-Doped Fiber Amplifiers

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