High rectification ratios of Fe–porphyrin molecules on Au facets

Wang, Xiaoyu; Wang, G.-C.; Lewis, Kim

doi:10.1016/j.matchemphys.2012.06.051

Cited by 9 publications

(10 citation statements)

References 37 publications

(39 reference statements)

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“…When compared to measurements of other molecular junctions [11], the measured current is within the same range, but the rectification ratio is not comparable. Similar to the molecular junctions in our previous work [12], the current is in a different range; however, the rectification ratio is consistent with our results. This may suggest that the rectification ratio depends on the molecule forming the molecular junction, but that the current can change with the size of AFM tip and the number of molecules that is measured in the junction.…”

Section: Resultssupporting

confidence: 93%

“…The rectification behavior was observed in the negative current and voltage direction. When the tip was biased as reported in previous work [12] the rectification was observed in the positive voltage regime. For the purpose of convention the current and voltage values of the original plot was inverted.…”

Section: Resultssupporting

confidence: 53%

“…The explanation for the rectification has been discussed in previous work [12]. This explanation is based on a model of the alignment of energy levels between the molecule and electrode (i.e.…”

Section: Resultsmentioning

confidence: 97%

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Stability of rectification of iron porphyrin molecular junctions

Qian

Zhou

Lewis

2016

Materials Chemistry and Physics

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We report rectification from porphyrin molecules ligated to an iron atom. Current-voltage (IV) curves were measured from the molecules using a conductive atomic force microscope (AFM). Molecules were deposited on a substrate from template-stripped gold from 1 µM iron porphyrin solution by either a drop-dry or 60 second deposition method. The measured IV curves from the drop-dry samples were stable. Statistical analysis of the IV curves showed that the distribution of the threshold voltages (0.543 V-0.588 V) and rectification ratios (34-42) from the drop-dry samples are confined to a smaller range than the threshold voltages (0.2 V-0.7 V) and rectification ratios (2.5-162) from the 60 second samples. The fluctuations in the IV curve from the 60 second deposition samples can be explained by local joule heating. The roughness of the topography was analyzed to understand the difference in IV measurements between the two types of samples. The stability of the rectification from the drop-dry samples is attributed to good thermal contact between the AFM tip and the molecules on the substrate.

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Section: Resultssupporting

confidence: 93%

Section: Resultssupporting

confidence: 53%

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Stability of rectification of iron porphyrin molecular junctions

Qian

Zhou

Lewis

2016

Materials Chemistry and Physics

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“…Porphyrin supramolecular structures can be formed on metal substrate surfaces as a result of metal-porphyrin and porphyrin-porphyrin interactions [9]. As such, individual molecules can be considered as single nanometer devices [10][11][12]. There have been several fascinating studies of coupling between the porphyrin molecules and the thin layers of substrates [13][14][15][16][17].…”

Section: Introductionmentioning

confidence: 99%

Surface Morphology of Fe(III)-Porphyrin Thin Layers as Characterized by Atomic Force Microscopy

Utari¹,

Kusumandari²,

Purnama³

et al. 2018

Indones. J. Chem.

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“…Investigations of the conductivity of porphyrins have focused mainly on single molecules using scanning tunneling microscopy (STM) [11][12][13][14][15][16]. However, conductive probe-atomic force microcopy (CP-AFM) has become a practical tool for characterizing the conductive properties of organic films and assemblies in ambient conditions [14,[17][18][19][20][21][22][23]. Early studies focused on applying CP-AFM to detect the conductivity of thiol selfassembled monolayers (SAMs) [21,[23][24][25][26].…”

Section: Introductionmentioning

confidence: 99%

Conductive-probe measurements with nanodots of free-base and metallated porphyrins

Zhai

Arachchige

Derosa

et al. 2017

Journal of Colloid and Interface Science

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The conductive properties of nanodots of model porphyrins were investigated using conductive-probe atomic force microscopy (CP-AFM). Porphyrins provide excellent models for preparing surface structures that can potentially be used as building blocks for devices. The conjugated, planar structure of porphyrins offers opportunities for tailoring the electronic properties. Two model porphyrins were selected for studies, 5,10,15,20-tetraphenyl-21H,23H-porphine cobalt(II) (TPC) and its metal-free analog 5,10,15,20-tetraphenyl-21H,23H-porphine (TPP). Nanodots of TPP and TPC were prepared within a dodecanethiol resist on gold using particle lithography. The nanopatterned surfaces exhibit millions of reproducible test structures of porphyrin nanodots. The porphyrin nanodots have slight differences in dimensions at the nanoscale, to enable size-dependent measurements of conductive properties. The size of the nanodots corresponds to ∼5-7 layers of porphyrin. The conductivity along the vertical direction of the nanodots was measured by applying a bias voltage between the gold surface and a metal-coated AFM cantilever. The TPP nanodots exhibited semi-conductive profiles while the TPC nanodots exhibited profiles that are typical of a conductive film or molecular wire. The engineered nanostructures of porphyrins provide an effective platform for investigation and measurement of conductive properties.

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High rectification ratios of Fe–porphyrin molecules on Au facets

Cited by 9 publications

References 37 publications

Stability of rectification of iron porphyrin molecular junctions

Stability of rectification of iron porphyrin molecular junctions

Surface Morphology of Fe(III)-Porphyrin Thin Layers as Characterized by Atomic Force Microscopy

Conductive-probe measurements with nanodots of free-base and metallated porphyrins

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