2000
DOI: 10.1063/1.126276
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High rate epitaxial lift-off of InGaP films from GaAs substrates

Abstract: Centimeter sized, crack-free single crystal InGaP films of 1 μm thickness were released from GaAs substrates by a weight-induced epitaxial lift-off process. At room temperature, the lateral etch rate of the process as a function of the applied Al0.85Ga0.15As release layer thickness was found to have a maximum of 3 mm/h at 3 nm. Using 5-nm-thick AlAs release layers, the etch rate increased exponentially with temperature up to 11.2 mm/h at 80 °C. Correlation of the experimental data with the established theoreti… Show more

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Cited by 78 publications
(79 citation statements)
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“…The ELO process involves the selective etching of an intermediate AlAs release layer, resulting in thin film cell structures and thus allowing reuse of the wafer. Over the years this research has yielded significant increases in etch rate, 3,4 an increase in sample size up to 4 inch wafers, [4][5][6] thin-film GaAs cells with record efficiencies (26.1%), 7 and the demonstration of its potential for space applications. 8 In recent years the importance of the ELO technology for PV applications has received wide-spread attention, resulting in further increase of the thin-film GaAs cell efficiency to 28.3% 9 and industrial interest for genuine thin-film cell production.…”
mentioning
confidence: 99%
“…The ELO process involves the selective etching of an intermediate AlAs release layer, resulting in thin film cell structures and thus allowing reuse of the wafer. Over the years this research has yielded significant increases in etch rate, 3,4 an increase in sample size up to 4 inch wafers, [4][5][6] thin-film GaAs cells with record efficiencies (26.1%), 7 and the demonstration of its potential for space applications. 8 In recent years the importance of the ELO technology for PV applications has received wide-spread attention, resulting in further increase of the thin-film GaAs cell efficiency to 28.3% 9 and industrial interest for genuine thin-film cell production.…”
mentioning
confidence: 99%
“…Optimization strategies include the preparation of nanoisland-type nanoemitter structures on an insulating, possibly lattice matched film, grown on top of the epilayer, the optimization of interface electronics and the use of non-noble metal nanoemitter materials that are capped by only a thin layer of noble metal catalysts. For technological applications, the use of thin films is mandatory and processes such as CLEFT (cleavage of epitaxial layers for transfer) 87,88 or PEEL (preferentially etched epitaxial liftoff) 89 should be considered. Fig.…”
mentioning
confidence: 99%
“…Performing the ELO process in the chemical reaction rate limited regime is preferred as it can maximize the overall etch rate. In order to do so, several methods with sophisticated setups, for example, weight-assisted ELO 30 and etching assisted by roller 15,31 , were developed to accelerate the ELO process. However, these are only single-wafer solutions with consequent low throughput.…”
Section: Resultsmentioning
confidence: 99%