2016
DOI: 10.1515/zkri-2016-1949
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High-quality structures at high pressure? Insights from inclusions in diamonds

Abstract: We describe the experimental protocols necessary to measure the crystal structures of minerals trapped within diamonds by single-crystal X-ray diffraction to the same quality as obtained from minerals studied at ambient conditions. The results show that corrections for X-ray absorption in complex cases can be made with good precision. Comparison of the refined structure of a single-crystal olivine inclusion inside a diamond with the structure of a similar olivine held in a high-pressure diamond-anvil cell show… Show more

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Cited by 7 publications
(3 citation statements)
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“…Data on samples from Damtshaa and Panda were collected at Department of Geosciences, University of Padua, using a Rigaku Oxford Diffraction SuperNova diffractometer equipped with a Mo micro-source X-ray tube and a Dectris Pilatus-200 K detector, controlled by the Crysalis-Pro™ software [Rigaku Oxford Diffraction]. Centring of the inclusion and data collections were performed with a ϕ-scan from 0 to 360° (see Angel et al 2016).…”
mentioning
confidence: 99%
“…Data on samples from Damtshaa and Panda were collected at Department of Geosciences, University of Padua, using a Rigaku Oxford Diffraction SuperNova diffractometer equipped with a Mo micro-source X-ray tube and a Dectris Pilatus-200 K detector, controlled by the Crysalis-Pro™ software [Rigaku Oxford Diffraction]. Centring of the inclusion and data collections were performed with a ϕ-scan from 0 to 360° (see Angel et al 2016).…”
mentioning
confidence: 99%
“…SCXRD experiments carried out in diamond anvil cell (DAC) pose certain experimental difficulties [2,11]. When high pressure is being applied, the mosaicity of the studied crystals usually increases, causing broadening of the diffraction spots and loss of intensity of high-angle reflections [12].…”
Section: Experimental Considerationsmentioning
confidence: 99%
“…X-ray diffraction (XRD), Synchrotron-based X-ray Tomographic Microscopy (SRXTM) and Alternating Gradient Field Magnetometry. In particular, XRD allows to determine the crystal structure of the inclusions in a repeatable way without altering them [29][30][31][32], while SRXTM is performed to establish which inclusions can be regarded as epigenetic by searching for the potential presence of frac-tures connecting them to the surface all along the diamond interiors [33]. SRXTM allows also to give a reasonable estimate of the linear size, volume and shape of the host-inclusion system, which is an important piece of information to determine more precisely the magnetization of the inclusions or to perform numerical calculations.…”
Section: Introductionmentioning
confidence: 99%