We report on the boron-doping dependence of the structural and electronic properties in nanocrystalline silicon (nc-Si:H) films directly deposited by plasmaenhanced chemical vapor deposition (PECVD). The crystallinity, micro-structure, and dark conductivity (σ d ) of the films were investigated by gradually varying a ratio of trimethylboron [B(CH 3 ) 3 or TMB] to silane (SiH 4 ) from 0.1 to 2 %. It was found that the low level of boron doping (≤ 0.2 %) first compensated the nc-Si:H material which demonstrates slightly n-type properties. As the doping increased up to 0.5 %, the maximum σ d of 1.11 S/cm was obtained while high crystalline fraction (X c ) of the films (over 70 %) was maintained. However, further increase in the TMB-to-SiH 4 ratio reduced σ d to the order of 10 -7 S/cm due to a phase transition of the films from nanocrystalline to amorphous, which was indicated by Raman spectra measurements. P-channel nc-Si:H thin film transistors (TFTs) with top gate and staggered source/drain contacts were fabricated using the developed p + nc-Si:H layer. The fabricated TFT exhibits a threshold voltage (V Tp ) of -26.2 V and field effective mobility of holes (µ p ) of 0.24 cm 2 /V·s. Mater. Res. Soc. Symp. Proc. Vol. 989