“…Two types of samples are used in these experiments, InP seed on Si and InP substrates. To facilitate SAG, ~ 150 nm thick SiO 2 mask is deposited using PECVD and soft UV- NIL is used for pattern definition (17). Nano sized circular openings with varying diameters and pitches are defined by standard reactive ion etching (RIE) of SiO 2 mask using photoresist as an etch mask.…”
Section: Nano Pyramidal Frusta Of Inp On Simentioning
confidence: 99%
“…The eight sides surrounding the top flat surface are low index facets. The exact index of these facets is revealed by the line scan of NPF sidewalls using AFM, which resulted in two angles, 54° for {111} planes and 45° for {110} planes (17). Incorporation of growth rate determining species in these confined areas during HVPE growth controls the crystal symmetry rearrangement that results in the formation of these planes (26).…”
Section: Nano Pyramidal Frusta Of Inp On Simentioning
confidence: 99%
“…But such QD structures put a strict demand on the site and size control with optimal density to achieve homogenous operation over a long period of time. These conditions could however be met with our proposed technique, where size, site and density of such structures can be controlled by the pattern design and growth time (17). These NPF are indeed a perfect example of this, where flat top surface of NPF can be used for the SAG growth of QD structures (28).…”
Section: Nano Pyramidal Frusta Of Inp On Simentioning
confidence: 99%
“…Quantum dot (QD) lasers have several advantages over QW lasers such as lower temperature insensitive laser threshold current density, larger modulation bandwidth (12) (13) (14) and in addition, these can generate single photon sources ( 15), entangled photon sources ( 16 ) and quantum bits for quantum computation. We demonstrate that templates with InP frusta on silicon for QD growth can be achieved by combining nanoimprinting and epitaxial growth (17). Morphological and optical studies of these templates are indicative of their potential for monolithic integration of QDs on silicon for silicon photonics and nanophotonics.…”
Monolithic integration of InP based structures on Si for optical interconnects is presented. Different strategies are demonstrated to achieve requisite InP platform on Si. In the first strategy, defect free isolated areas of epitaxially and laterally overgrown InP are obtained on Si and the InGaAsP based quantum wells directly grown on these templates have shown high material quality with uniform interfaces. In the second strategy, selective area growth is exploited to achieve InP nano pyramids on Si which can be used for the growth of quantum dot structures. In the third and the final strategy, a method is presented to achieve direct interface between InP and Si using corrugated epitaxial lateral overgrowth.
“…Two types of samples are used in these experiments, InP seed on Si and InP substrates. To facilitate SAG, ~ 150 nm thick SiO 2 mask is deposited using PECVD and soft UV- NIL is used for pattern definition (17). Nano sized circular openings with varying diameters and pitches are defined by standard reactive ion etching (RIE) of SiO 2 mask using photoresist as an etch mask.…”
Section: Nano Pyramidal Frusta Of Inp On Simentioning
confidence: 99%
“…The eight sides surrounding the top flat surface are low index facets. The exact index of these facets is revealed by the line scan of NPF sidewalls using AFM, which resulted in two angles, 54° for {111} planes and 45° for {110} planes (17). Incorporation of growth rate determining species in these confined areas during HVPE growth controls the crystal symmetry rearrangement that results in the formation of these planes (26).…”
Section: Nano Pyramidal Frusta Of Inp On Simentioning
confidence: 99%
“…But such QD structures put a strict demand on the site and size control with optimal density to achieve homogenous operation over a long period of time. These conditions could however be met with our proposed technique, where size, site and density of such structures can be controlled by the pattern design and growth time (17). These NPF are indeed a perfect example of this, where flat top surface of NPF can be used for the SAG growth of QD structures (28).…”
Section: Nano Pyramidal Frusta Of Inp On Simentioning
confidence: 99%
“…Quantum dot (QD) lasers have several advantages over QW lasers such as lower temperature insensitive laser threshold current density, larger modulation bandwidth (12) (13) (14) and in addition, these can generate single photon sources ( 15), entangled photon sources ( 16 ) and quantum bits for quantum computation. We demonstrate that templates with InP frusta on silicon for QD growth can be achieved by combining nanoimprinting and epitaxial growth (17). Morphological and optical studies of these templates are indicative of their potential for monolithic integration of QDs on silicon for silicon photonics and nanophotonics.…”
Monolithic integration of InP based structures on Si for optical interconnects is presented. Different strategies are demonstrated to achieve requisite InP platform on Si. In the first strategy, defect free isolated areas of epitaxially and laterally overgrown InP are obtained on Si and the InGaAsP based quantum wells directly grown on these templates have shown high material quality with uniform interfaces. In the second strategy, selective area growth is exploited to achieve InP nano pyramids on Si which can be used for the growth of quantum dot structures. In the third and the final strategy, a method is presented to achieve direct interface between InP and Si using corrugated epitaxial lateral overgrowth.
“…For example, improved manufacturing paths have enabled the fabrication of low-loss passive devices such as filters, waveguides, beam splitters and combiners, which are now standard available devices. [1][2][3][4] However, the development of active devices and, in particular, the integration of efficient light sources remain an open engineering challenge as far as heat dissipation is concerned. The successful fabrication of such integrated de-vices holds the key to accomplishing the long-term dream of the photonics and electronics industries: a fully integrated III-V/Si platform.…”
The integration of III-V optoelectronic devices on silicon is confronted with the challenge of heat dissipation for reliable and stable operation. A thorough understanding and characterization of thermal transport is paramount for improved designs of, for example, viable III-V light sources on silicon. In this work, the thermal conductivity of heteroepitaxial laterally overgrown InP layers on silicon is experimentally investigated using microRaman thermometry. By examining InP mesa-like structures grown from trenches defined by a SiO 2 mask, we found that the thermal conductivity decreases by about one third, compared to the bulk thermal conductivity of InP, with decreasing width from 400 to 250 nm. The high thermal conductivity of InP grown from 400 nm trenches was attributed to the lower defect density as the InP microcrystal becomes thicker. In this case, the thermal transport is dominated by phonon-phonon interactions as in a low defect-density monocrystalline bulk material, whereas for thinner InP layers grown from narrower trenches, the heat transfer is dominated by phonon scattering at the extended defects and InP/ SiO 2 interface. In addition to the nominally undoped sample, sulfur-doped (1 × 10 18 cm −3) InP grown on Si was also studied. For the narrower doped InP microcrystals, the thermal conductivity decreased by a factor of two compared to the bulk value. Sources of errors in the thermal conductivity measurements are discussed. The experimental temperature rise was successfully simulated by the heat diffusion equation using the FEM.
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