1995
DOI: 10.1063/1.114445
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High-quality GaN epitaxial layer grown by metalorganic vapor phase epitaxy on (111) MgAl2O4 substrate

Abstract: We grew GaN crystals by metalorganic vapor phase epitaxy on (111) and (100) MgAl2O4 substrates. We obtained a single-crystal GaN layer with a specular surface on the (111) substrate. The full width of half-maximum of the x-ray rocking curve for a 3.6 μm thick GaN layer was 310 s, comparable to the reported values for GaN on Al2O3 substrates. In the room-temperature photoluminescence, a band-edge emission at around 360 nm was dominant. A smooth cleaved (11̄00) facet of the GaN epitaxial layer was obtained, assi… Show more

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Cited by 94 publications
(37 citation statements)
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“…1. Finally, contrary to c-plane sapphire, (1 1 1)-oriented spinel exhibits oblique (0 0 1)-cleavage planes propagating perpendicularly to the surface in the above-laying GaN, thus facilitating the formation of parallel facets for the realization of horizontal-cavity GaN-based laser diodes (LDs) [5,8].…”
Section: Article In Pressmentioning
confidence: 99%
See 1 more Smart Citation
“…1. Finally, contrary to c-plane sapphire, (1 1 1)-oriented spinel exhibits oblique (0 0 1)-cleavage planes propagating perpendicularly to the surface in the above-laying GaN, thus facilitating the formation of parallel facets for the realization of horizontal-cavity GaN-based laser diodes (LDs) [5,8].…”
Section: Article In Pressmentioning
confidence: 99%
“…3 The thermal mismatch is respon- ). Stoichiometric spinel (MgAl 2 O 4 , n ¼ 1), which has been studied extensively for GaN heteroepitaxy since 1995 [5][6][7][8][9][10], has given very promising results. Unfortunately, the brittleness of this material makes it very difficult to grow and process as wafers, so that the manufacture of large diameter wafers at a reasonable cost is most unlikely.…”
Section: Introductionmentioning
confidence: 99%
“…However, large mismatches in lattice constant (16%) and thermal expansion coefficient (34%) between GaN and Al 2 O 3 cause the stress problems [5,6], such as cracking, wafer bowing and high density of crystalline defects. Furthermore, Al 2 O 3 has little tendency toward cleavage, and the (11 0 0) cleavage plane of GaN is rotated 30 • from the (11 0 0) cleavage plane of Al 2 O 3 [7]. It is almost impossible to realize cavity mirrors of laser diodes by the cleavage.…”
Section: Introductionmentioning
confidence: 97%
“…GaN growth in both of those cases was obtained through metalorganic chemical vapor deposition (MOCVD). Some more recent efforts to reduce the amount of defects in GaN even further include (a) using substrates made from SiC [14], spinel (MgAl 2 O 4 ) [15], or other materials (which may have a more closely matched lattice constant), (b) using the technique of lateral epitaxial overgrowth [16], and (c) growing bulk (non-epitaxial) samples under high pressure [17].…”
Section: -4) Another Major Breakthrough Inmentioning
confidence: 99%