High-Q LaAlO/sub 3/ dielectric resonator shielded by YBCO-films

Tellmann, N.; Glein, N.; Dähne, U.; Scholen, A.; Schulz, H.; Chaloupka, H.

doi:10.1109/77.317829

Cited by 33 publications

(5 citation statements)

References 10 publications

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“…The R S of all the specimens is measured by using the dielectric resonator method at temperatures from 10 to 88 K at 8.5 GHz [24][25][26][27][28]. In figure 3(b), we show a diagram of the rutile resonator used throughout this study.…”

Section: Measurements Of the Microwave Surface Resistancementioning

confidence: 99%

Depth profiling of the microwave surface resistance of high-J_CGdBa₂Cu₃O_7−δcoated conductors grown using the RCE-DR process

Yang

Jung

Lee³

et al. 2016

Supercond. Sci. Technol.

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We study depth profiling of the microwave surface resistance (RS) of GdBa2Cu3O7−δ (GdBCO) coated conductors (CCs) grown using the reactive co-evaporation by deposition and reaction (RCE-DR) method, a method enabling extremely high deposition rate. GdBCO CCs with the critical current (IC) of more than 790 A cm−1 at 77 K in self-field are used for the study. The RS of the GdBCO CCs is measured at temperatures of 10–80 K using a 8.5 GHz TE011-mode rutile resonator, which is compared with that of YBa2Cu3O7−δ films and GdBCO films epitaxially grown on single crystal substrates. It turns out that there is significant inhomogeneity in the RS over the thickness of the GdBCO layer, with the RS value of the top part at 30 K being almost two times higher than the corresponding one of the bottom part. A transmission electron microscopy study reveals that Gd2O3 grains coexist with GdBCO grains with the average Gd2O3 grain sizes being ∼150 nm at the top and ∼100 nm at the bottom of the GdBCO layer. We relate the inhomogeneity in the RS of the GdBCO layer with the positional dependence of the Gd2O3 grain size, for which effects of the dielectric losses from the Gd2O3 grains on the measured RS of the GdBCO layer are considered. Our results imply that the critical current density, another important transport property of superconductors, could be inhomogeneous over the thickness of the GdBCO layer grown using the RCE-DR method.

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Section: Measurements Of the Microwave Surface Resistancementioning

confidence: 99%

Depth profiling of the microwave surface resistance of high-J_CGdBa₂Cu₃O_7−δcoated conductors grown using the RCE-DR process

Yang

Jung

Lee³

et al. 2016

Supercond. Sci. Technol.

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“…The first use of DRs to microwave characterisation of HTS materials was proposed (to the knowledge of authors) in 1989 by Fieduszko and Heideman [4]. Since then several groups [5][6][7][8][9][10][11][12][13][14][15][16] have developed variety of designs for this purpose.…”

Section: Introductionmentioning

confidence: 99%

Dielectric resonators for microwave characterization of high-temperature superconductors

Ceremuga

Křupka

1996

Oxide Superconductor Physics and Nano-Engineering II

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“…For a given input power, the energy stored in the resonator can be calculated from a closed expression [3], [9]. When the resonator is critically coupled, and the following equation can be used: (3) where is the quality factor of the resonator, is the resonant frequency, is the energy stored in the resonator, and is the input power.…”

Section: Power-handling Capabilitymentioning

confidence: 99%

“…When the resonator is critically coupled, and the following equation can be used: (3) where is the quality factor of the resonator, is the resonant frequency, is the energy stored in the resonator, and is the input power. The scaling is done by noting that the maximum peak value of the magnetic field on the HTS surface is proportional to the energy stored in the resonator, with a proportionality constant which only depends on the mode (4) where is the actual maximum peak value of magnetic field, the value obtained through numerical calculation, and the energy obtained in the numerical analysis.…”

Section: Power-handling Capabilitymentioning

confidence: 99%

“…High current densities due to edge effects in transmission-line-based filters prevent their utilization for high-power applications. Recently, some interest has been put in the new hybrid dielectric/HTS resonator as a possible resonator structure for high-power HTS filters [1]- [3]. This resonator structure provides small size, high quality factor, and good thermal stability, allowing the realization of reduced size hybrid dielectric/HTS dual-mode filters for high-power applications.…”

Section: Introductionmentioning

confidence: 99%

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Full-wave analysis of image hybrid dielectric/HTS resonator

et al. 1997

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Abstract-An analysis of the image hybrid dielectric/hightemperature superconductor (HTS) resonator is carried out. A full-wave radial mode-matching method is used to obtain the electromagnetic fields inside the resonator for single TE01 and dual HE11 modes. Measured resonant frequencies and quality factors of these modes are compared with numerical results of the analysis. The resonator power-handling capability is estimated from the field at the surface of the HTS film, assuming a certain value for the critical field of the HTS film.

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High-Q LaAlO/sub 3/ dielectric resonator shielded by YBCO-films

Cited by 33 publications

References 10 publications

Depth profiling of the microwave surface resistance of high-J_CGdBa₂Cu₃O_7−δcoated conductors grown using the RCE-DR process

Depth profiling of the microwave surface resistance of high-J_CGdBa₂Cu₃O_7−δcoated conductors grown using the RCE-DR process

Dielectric resonators for microwave characterization of high-temperature superconductors

Full-wave analysis of image hybrid dielectric/HTS resonator

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High-Q LaAlO/sub 3/ dielectric resonator shielded by YBCO-films

Cited by 33 publications

References 10 publications

Depth profiling of the microwave surface resistance of high-JCGdBa2Cu3O7−δcoated conductors grown using the RCE-DR process

Depth profiling of the microwave surface resistance of high-JCGdBa2Cu3O7−δcoated conductors grown using the RCE-DR process

Dielectric resonators for microwave characterization of high-temperature superconductors

Full-wave analysis of image hybrid dielectric/HTS resonator

Contact Info

Product

Resources

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Depth profiling of the microwave surface resistance of high-J_CGdBa₂Cu₃O_7−δcoated conductors grown using the RCE-DR process

Depth profiling of the microwave surface resistance of high-J_CGdBa₂Cu₃O_7−δcoated conductors grown using the RCE-DR process