2018
DOI: 10.1063/1.5053220
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High-pressure angle-dispersive X-ray diffraction study of mechanically alloyed SnSe2

Abstract: The effect of pressure on mechanically alloyed trigonal nanostructured SnSe2 (n-SnSe2) was studied by in situ angle-dispersive X-ray diffraction up to 25.8 GPa. The pressure dependence of lattice parameters and unit cell volume was investigated. By fitting the lattice parameters and unit cell volume to a third-order Birch–Murnaghan equation of state for several values of the applied pressure, the bulk modulus B0, its first derivative B′, and the linear moduli along the a- and c-axes were determined. The effect… Show more

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Cited by 10 publications
(7 citation statements)
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“…A significant improvement in ZT under pressure has also been predicted for other common thermoelectric materials, namely, p-type SnSe 131 and n-type SnSe 2 . 132,133 The high-pressure phases of these chalcogenide semiconductors are not quenchable at ambient conditions, whereas local strains in their crystal lattices that simulate high-pressure effects may be generated in meso-or nanostructured samples or in composites prepared by HP-HT synthesis. For example, a high value of ZT = 0.88 at 473 K was estimated for an n-type (PbTe) 1−x (CoTe) x composite with x = 0.14, prepared by HP-HT synthesis at 6 GPa.…”
Section: B (Pbsn)(tese) and Related Thermoelectric Materialsmentioning
confidence: 99%
“…A significant improvement in ZT under pressure has also been predicted for other common thermoelectric materials, namely, p-type SnSe 131 and n-type SnSe 2 . 132,133 The high-pressure phases of these chalcogenide semiconductors are not quenchable at ambient conditions, whereas local strains in their crystal lattices that simulate high-pressure effects may be generated in meso-or nanostructured samples or in composites prepared by HP-HT synthesis. For example, a high value of ZT = 0.88 at 473 K was estimated for an n-type (PbTe) 1−x (CoTe) x composite with x = 0.14, prepared by HP-HT synthesis at 6 GPa.…”
Section: B (Pbsn)(tese) and Related Thermoelectric Materialsmentioning
confidence: 99%
“…It is thus more likely that the thickness fringes arise from a parasitic SnSe 2 layer in the film. Indeed, literature attributes the {001} hexagonal SnSe 2 orientations to both the peaks at 13.8° 44 and 16.6°, 45 labeled with the symbols and ✦, respectively. The appearance of parasitic SnSe 2 fingerprints in the XRD data point toward a relatively uncontrolled formation process that does not depend on the supplied Sn : Se flux ratio.…”
Section: Resultsmentioning
confidence: 99%
“…For instance, the lengths of the a and c axes at 10 GPa are reduced by about 3% and 11% with respect to their zeropressure values in both cases. As the pressure increases, the compressibility rate along the a axis becomes slightly smaller in SnS 2 than in SnSe 2 , following the expected trend that a more covalent intra-layer bond is less compressible 47 [see Supplemental Fig. S1 51 ].…”
Section: Resultsmentioning
confidence: 86%
“…Fig. 1(b)-(e) presents the optimized structural parameters as a function of pressure, together with available experimental data for comparison 19,28,[47][48][49][50] .…”
Section: Resultsmentioning
confidence: 99%