High-precision soft x-ray polarimeter at Diamond Light Source

Wang, H.; Dhesi, S. S.; Maccherozzi, Francesco; Cavill, S. A.; Shepherd, E. L.; Yuan, Fajin; Deshmukh, Ratnadeep R.; Scott, Stewart M.; Laan, G. van der; Sawhney, Kawal

doi:10.1063/1.3665928

Cited by 20 publications

(14 citation statements)

References 33 publications

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“…Knowledge of the degree of polarization is vital, not only for understanding the undulator or beamline performance but also to carry out precise analysis of experiments in order to understand material properties. Hence, a dedicated soft X-ray polarimeter was recently developed for accurately characterizing the polarization performance of these beamlines (Wang et al, 2011). For this paper, one APPLE II undulator was operated in both the linear arbitrary mode and elliptical polarization mode, and the variable polarization states of the emitted radiation from the undulator were fully characterized at 712 eV using the multilayer-based polarimeter.…”

Section: Introductionmentioning

confidence: 99%

Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter

Wang

Benčok

Steadman

et al. 2012

J Synchrotron Radiat

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Two APPLE II undulators installed on the Diamond I10 beamline have all four magnet arrays shiftable and thus can generate linear polarization at any arbitrary angle from 0° to 180°, as well as all other states of elliptical polarization. To characterize the emitted radiation polarization state from one APPLE II undulator, the complete polarization measurement was performed using a multilayer-based soft X-ray polarimeter. The measurement results appear to show that the linear polarization angle offset is about 6° compared with other measurements at 712 eV, equivalent to an undulator jaw phase offset of 1.1 mm. In addition, the polarization states of various ellipticities have also been measured as a function of the undulator row phase.

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Section: Introductionmentioning

confidence: 99%

Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter

Wang

Benčok

Steadman

et al. 2012

J Synchrotron Radiat

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“…The high-precision Diamond polarimeter employed to carry out these measurements is a multilayer-based system containing a transmission phase retarder and reflection analyzer (Wang et al, 2011). These are mounted in two azimuthally rotating stages which allow the retarder ( ) and analyser ( ) to rotate independently about the optical axis of the beam.…”

Section: Methodsmentioning

confidence: 99%

Quantitative investigation of linear arbitrary polarization in an APPLE-II undulator

Hand

Wang

Maccherozzi

et al. 2018

J Synchrotron Radiat

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Insertion devices are utilized at synchrotron radiation facilities around the world for their capability to provide a high-brilliance X-ray beam. APPLE-II type undulators are especially important for their capacity to switch between a variety of photon beam polarization states. A high-precision soft X-ray polarimeter has been used to investigate the polarization calibration of an APPLE-II undulator (period length u = 64 mm) installed on beamline I06 at Diamond Light Source. Systematic measurement of the beam polarization state at a range of linear arbitrary angles has been compared with the expected result for a given set of undulator gap and row phase parameters calculated from theory. Determination of the corresponding Stokes-Poincaré parameters from the measured data reveals a discrepancy between the two. The limited number of energy/polarization combinations included in the undulator calibration tables necessitates the use of interpolated values for the missing points which is expected to contribute to the discrepancy. However, by modifying the orbit of the electron beam through the undulator by at least 160 mm it has been found that for certain linear polarizations the discrepancies can be corrected. Overall, it is suggested that complete correction of the Stokes-Poincaré parameters for all linear angles would require alteration of both these aspects.

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“…Several established methods exist to characterize the polarization of an undulator [27,[37][38][39][40]. In our previous work [28], we extensively compared the merits of different instruments, namely, an optical, a fluorescence, and an eTOF polarimeter.…”

Section: The Electron Time-of-flight Polarimetermentioning

confidence: 99%

Polarization Characterization of Soft X-Ray Radiation at FERMI FEL-2

et al. 2017

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Abstract:The control of polarization state in soft and hard X-ray light is of crucial interest to probe structural and symmetry properties of matter. Thanks to their Apple-II type undulators, the FERMI-Free Electron Lasers are able to provide elliptical, circular or linearly polarized light within the extreme ultraviolet and soft X-ray range. In this paper, we report the characterization of the polarization state of FERMI FEL-2 down to 5 nm. The results show a high degree of polarization of the FEL pulses, typically above 95%. The campaign of measurements was performed at the Low Density Matter beamline using an electron Time-Of-Flight based polarimeter.

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High-precision soft x-ray polarimeter at Diamond Light Source

Cited by 20 publications

References 33 publications

Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter

Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter

Quantitative investigation of linear arbitrary polarization in an APPLE-II undulator

Polarization Characterization of Soft X-Ray Radiation at FERMI FEL-2

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