1992
DOI: 10.1117/12.60530
|View full text |Cite
|
Sign up to set email alerts
|

High-precision MTF measurement instrument for focal-plane arrays with on-chip TDI

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1998
1998
2001
2001

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…In reference to the convolution terminology, this is to say: G ' is the convolution of G and F and g ' is the product of g and f, then we have the image forming theory expressed in two ways: (4) and G'(x,y)J J_ K(x-x0,y-y0) 2G(x0 ,y0)dx0dy0 (5) where K is the amplitude point spread function at (x, y) due to the disturbance at (x , yj, G' means the product factor of the contrast of a grating, and the exponential term indicates the lateral shift of the image of the grating in comparison to the ideal image.…”
Section: Technical Backgroundmentioning
confidence: 99%
“…In reference to the convolution terminology, this is to say: G ' is the convolution of G and F and g ' is the product of g and f, then we have the image forming theory expressed in two ways: (4) and G'(x,y)J J_ K(x-x0,y-y0) 2G(x0 ,y0)dx0dy0 (5) where K is the amplitude point spread function at (x, y) due to the disturbance at (x , yj, G' means the product factor of the contrast of a grating, and the exponential term indicates the lateral shift of the image of the grating in comparison to the ideal image.…”
Section: Technical Backgroundmentioning
confidence: 99%