Abstract:In this paper, we report high-precision absolute coordinate measurements performed with frequency scanned interferometry (FSI). We reported previously on measurements of absolute distance with the FSI method [1,2]. Absolute position is determined by several related absolute distances measured simultaneously. The achieved precision of 2-dimensional measurements is better than 1 micron, and in 3-dimensional measurements, the precision on X and Y is confirmed to be below 1 micron, while the confirmed precision on Z is about 2 microns, where the confirmation is limited by the lower precision of the available translational stage along the 3 rd dimension.