High-Power EMI on RF Amplifier and Digital Modulation Schemes

Bayram, Y.; Volakis, John L.; Myoung, Suk Keun; Doo, Seok Joo; Roblin, Patrick

doi:10.1109/temc.2008.2004600

Cited by 17 publications

(6 citation statements)

References 15 publications

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“…Proc. 2022, 14, 16 2 of 7 electromagnetic interference (EMI) [10,11]. The stress time range is of several pico, nano, or microseconds.…”

Section: Device and Uis Set-upmentioning

confidence: 99%

“…Defining the SOA depends heavily on the final application, as the final implementation requires different standards, as such, the breakdown mechanism will change accordingly [9]. Under short pulses, the device unavoidably will be under electrostatic discharge (ESD), as a charge device model (CDM), human body model (HBM) conditions, machine model (MM), and/or transmission line measurement (TLP), or even high-power electromagnetic interference (EMI) [10,11]. The stress time range is of several pico, nano, or microseconds.…”

Section: Introductionmentioning

confidence: 99%

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UIS Characterization of LOCOS-Based LDMOS Transistor Fabricated by 1 µm CMOS Process

Houadef

Djezzar

2022

The 1st International Conference on Computational Engineering and Intelligent Systems

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This paper investigates the ruggedness of an n-type LDMOS under single shot unclamped inductive switching (UIS) stress conditions. We present a detailed method to define the electrothermal safe operating area (SOA), and the physics of the failure mechanism is described. We conclude that the device robustness depends mainly on the gate bias, much less on the pulse duration on millisecond range, the inductive load value, or the initial operating temperature, although the Kirk effect is always present under all conditions. However, the failure mechanism fundamentally changes to pure avalanche breakdown under short pulses.

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“…Proc. 2022, 14, 16 2 of 7 electromagnetic interference (EMI) [10,11]. The stress time range is of several pico, nano, or microseconds.…”

Section: Device and Uis Set-upmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

UIS Characterization of LOCOS-Based LDMOS Transistor Fabricated by 1 µm CMOS Process

Houadef

Djezzar

2022

The 1st International Conference on Computational Engineering and Intelligent Systems

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“…The latter has been shown to provide military utility against pertinent threats as discussed above [1]. Specific examples of HPRF DEW applications are vehicle motor disruption [2], radio frequency amplifier and digital modulation scheme attack [3] and UAV defeat [4,5]. An overview of the usage of pulsed HPRF to disruption of electronic components in systems is provided in the context of intentional electromagnetic interference (IEMI) in [6,7], while [8] provides a useful summary of developments in IEMI.…”

Section: Introductionmentioning

confidence: 99%

Quantification of Combat Team Survivability With High Power Rf Directed Energy Weapons

Weinberg¹

2021

PIER M

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Modern combat teams face an increasingly complex battlefield, where threats may arise from a number of different sources. Examples include not only conventional attacks through rocket propelled grenades but also improvised explosive devices and weaponised unmanned aerial vehicles. Combat teams can now be equipped with sophisticated surveillance and reconnaissance capability, as well as automatically activated defences. The focus of this paper is to consider the utility of collaborative active protection systems, which are designed to provide an active defence against threats to a combat team. Specifically, a general statistical framework for the analysis of such systems is introduced, with a particular focus on high power radio frequency directed energy weapon countermeasures. The mathematical model allows for a subset of the combat team to be responsible for target detection and tracking, and a time-varying subset of team members with suitable countermeasures to be specified separately. The overall probability of threat defeat and team survivability is then derived. Some examples are provided to investigate the utility of such systems.

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“…For the system-level EMS analysis of an electronic system, many efforts have been devoted to the analysis of back-door coupling, such as the EM coupling to the systems with cables [2,3], apertures [4,5]. In consideration that many electronic systems have antennas for communication with external environment, analysis of front-door coupling is indispensable and significant.…”

Section: Introductionmentioning

confidence: 99%

System‐level SPICE model for predicting the effects of external incident EMI on a shielded communication system with an antenna

2017

IET Microwaves, Antennas & Propagation

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A system‐level SPICE model is proposed to predict the effects of external incident electromagnetic interference (EMI) on a shielded communication system with an antenna in this study. First, hybrid techniques are incorporated to develop a frequency‐domain equivalent circuit model for the electromagnetic (EM) coupling of the system. The system is divided into an external subsystem and an internal subsystem. A receiving equivalent circuit model is established using the Lorentz reciprocity theorem for the EM coupling of the external subsystem. A transmission equivalent circuit model is established using the segmentation method for the signal transmission in the internal subsystem. Then, in order to handle the non‐linear or time‐varying circuit devices in the system, the macromodelling technique is employed to convert the frequency‐domain equivalent circuit model into a time‐domain system‐level SPICE model. Both numerical simulation and experimental verification are carried out to validate the proposed model. Based on the system‐level SPICE model, bit error rate is calculated to evaluate the performance of the communication system under external incident EMI in the ADS simulator.

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High-Power EMI on RF Amplifier and Digital Modulation Schemes

Cited by 17 publications

References 15 publications

UIS Characterization of LOCOS-Based LDMOS Transistor Fabricated by 1 µm CMOS Process

UIS Characterization of LOCOS-Based LDMOS Transistor Fabricated by 1 µm CMOS Process

Quantification of Combat Team Survivability With High Power Rf Directed Energy Weapons

System‐level SPICE model for predicting the effects of external incident EMI on a shielded communication system with an antenna

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