2019
DOI: 10.1002/adfm.201907265
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High‐Performance Quantum‐Dot Light‐Emitting Diodes Using NiOx Hole‐Injection Layers with a High and Stable Work Function

Abstract: Solution-processed oxide thin films are actively pursued as hole-injection layers (HILs) in quantum-dot light-emitting diodes (QLEDs), aiming to improve operational stability. However, device performance is largely limited by inefficient hole injection at the interfaces of the oxide HILs and highionization-potential organic hole-transporting layers. Solution-processed NiO x films with a high and stable work function of ≈5.7 eV achieved by a simple and facile surface-modification strategy are presented. QLEDs b… Show more

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Cited by 63 publications
(61 citation statements)
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“…Further experiments, described later and detailed in the Supporting Information (Section S10), support this conclusion. Modification of the work function of the NiO x /perovskite interface, using aminobenzoic acid (“Amino”) or bromobenzoic acid (“Bromo”), [ 40–43 ] yields limited improvement in selectivity, and this improvement is independent of the direction the work function shifts (Figure S8, left, Supporting Information), supporting the hypothesis of an interfacial effect at the perovskite/NiO x junction. However, inserting thin polymeric HTLs between NiO x and the perovskite absorber—which can alleviate this interfacial effect—leads to a substantial improvement in selectivity, with a corresponding increase in V oc of more than 200 mV, resulting in our highest reported V oc of 1143 mV (Figure S8, right, Supporting Information).…”
Section: Resultsmentioning
confidence: 72%
“…Further experiments, described later and detailed in the Supporting Information (Section S10), support this conclusion. Modification of the work function of the NiO x /perovskite interface, using aminobenzoic acid (“Amino”) or bromobenzoic acid (“Bromo”), [ 40–43 ] yields limited improvement in selectivity, and this improvement is independent of the direction the work function shifts (Figure S8, left, Supporting Information), supporting the hypothesis of an interfacial effect at the perovskite/NiO x junction. However, inserting thin polymeric HTLs between NiO x and the perovskite absorber—which can alleviate this interfacial effect—leads to a substantial improvement in selectivity, with a corresponding increase in V oc of more than 200 mV, resulting in our highest reported V oc of 1143 mV (Figure S8, right, Supporting Information).…”
Section: Resultsmentioning
confidence: 72%
“…In contrast, our QLEDs using monolayer regular QD show much lower brightness at both the100% and 105% bandgap voltages, which are 10 and 27 cd m -2 (Figure 3a), respectively. In previously reported high performance QLEDs, brightness of 10 -600 cd m -2 can be obtained at the bandgap voltages (Extended Data Table 2) [4][5][6][7][8][9][10][11] , and to achieve a brightness of 3000 cd m -2 these devices need to be operated at more than 125% bandgap voltage. Due to the decreased driving voltage, the power conversion efficiencies of QLEDs using large QDs have also been remarkably improved.…”
Section: Figure 1|mentioning
confidence: 99%
“…It is the PCE that determines how energy efficient the QLEDs are, and high PCEs simultaneously require high EQEs and large irradiative recombination currents at low bias voltages 13 . Current state of art QLEDs ubiquitously adopt multiple QD layers, they are featured with high peak EQEs but small recombination currents around the bandgap voltages [4][5][6][7][8][9][10][11][12] . To achieve a brightness ranging from 1,000 to 3,000 cd m -2 -one that required for flat panel and outdoor displays 14,15 , bias voltages that noticeably higher than the bandgap voltage need to be applied.…”
mentioning
confidence: 99%
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“…Quantum‐dot light‐emitting diodes (QLEDs) have drawn considerable research interest because of their narrow emission linewidths, high electroluminescence efficiencies and low‐cost solution‐based fabrication process [1–4] . State‐of‐the‐art QLEDs generally adopt a multilayer structure of anode/hole‐injection layer (HIL)/hole‐transporting layer (HTL)/QDs/electron‐transporting layer (ETL)/metal cathode [3–21] . In this structure, solution‐processed transition metal oxides, including NiO x , VO x , WO x and MoO x , have been investigated as HILs for QLEDs [11,20,22–28] .…”
Section: Figurementioning
confidence: 99%