2023
DOI: 10.1002/adfm.202305386
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High‐Performance Memristors Based on Few‐Layer Manganese Phosphorus Trisulfide for Neuromorphic Computing

Zhengjin Weng,
Haofei Zheng,
Wei Lei
et al.

Abstract: While transition‐metal thiophosphate (MPX3) materials have been a subject of extensive research in recent years, experimental studies on MPX3‐based memristors are still in their early stages, with device performance being less than ideal. Here, the successful fabrication of high‐yield, high‐performance, and uniform memristors are demonstrated to possess desired characteristics for neuromorphic computing using a single‐crystalline few‐layered manganese phosphorus trisulfide (MnPS3) as a resistive switching medi… Show more

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Cited by 4 publications
(3 citation statements)
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“…The involved structure variations of Ag occupation and migration are also investigated, which have not been uncovered in other MPS memristors. , Obvious crystal structure variations are found after Ag occupies V S and V Mn in the MnPS. In particular, compared with the V Mn occupation, the V S occupation has a more remarkable distorted structure, as shown in Figure c–e.…”
Section: Resistive Switching Mechanismmentioning
confidence: 99%
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“…The involved structure variations of Ag occupation and migration are also investigated, which have not been uncovered in other MPS memristors. , Obvious crystal structure variations are found after Ag occupies V S and V Mn in the MnPS. In particular, compared with the V Mn occupation, the V S occupation has a more remarkable distorted structure, as shown in Figure c–e.…”
Section: Resistive Switching Mechanismmentioning
confidence: 99%
“…11,13,14 To the best of our knowledge, only the most common closestacked MPSs with elemental vacancies (such as Mn 2 P 2 S 6 and Ni 2 P 2 S 6 ) are reported as switching mediums. 15,16 The nondefective structural vacancy enabled memristors have not been studied and may provide a high-performance RS paradigm. It is known that the defects in the switching medium, which provide the migration path for the ion movement, have vital influences on the performance and reliability of the memristor.…”
mentioning
confidence: 99%
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