2020
DOI: 10.1002/adfm.202003285
|View full text |Cite
|
Sign up to set email alerts
|

High Performance Indium‐Gallium‐Zinc Oxide Thin Film Transistor via Interface Engineering

Abstract: Solution-processed indium-gallium-zinc oxide (IGZO) thin film transistors (TFTs) have become well known in recent decades for their promising commercial potential. However, the unsatisfactory performance of small-sized IGZO TFTs is limiting their applicability. To address this issue, this work introduces an interface engineering method of bi-functional acid modification to regulate the interfaces between electrodes and the channels of IGZO TFTs. This method increases the interface oxygen vacancy concentration … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

0
25
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 36 publications
(26 citation statements)
references
References 39 publications
0
25
0
Order By: Relevance
“…Metal-oxide semiconductors contain a metal cation (i.e., Zn, Cu, and Ni) [9,10] and an oxide anion, including ternary metal oxides, such as IZO [11], and quaternary metal oxides, such as IGZO [12]. Moreover, because conventional silicon-based transistors suffer from a limited form-factor, difficulty of the large-area process, and high-cost complex-to-fabricate process, metal oxide-based transistors have attracted interest for next-generation thin-film transistors (TFTs) in foldable, flexible, and stretchable displays and other electronic products [13][14][15].…”
Section: Introductionmentioning
confidence: 99%
“…Metal-oxide semiconductors contain a metal cation (i.e., Zn, Cu, and Ni) [9,10] and an oxide anion, including ternary metal oxides, such as IZO [11], and quaternary metal oxides, such as IGZO [12]. Moreover, because conventional silicon-based transistors suffer from a limited form-factor, difficulty of the large-area process, and high-cost complex-to-fabricate process, metal oxide-based transistors have attracted interest for next-generation thin-film transistors (TFTs) in foldable, flexible, and stretchable displays and other electronic products [13][14][15].…”
Section: Introductionmentioning
confidence: 99%
“…Thin film transistors (TFTs) based on metal oxide semiconductor (MOS) have attracted remarkable attention due to the intrinsic merits of high optical transparency and excellent electrical properties [1,2] . In the past few years, great endeavors have been made in the investigation of n-channel TFT with excellent performance.…”
Section: Introductionmentioning
confidence: 99%
“…In the past few years, great endeavors have been made in the investigation of n-channel TFT with excellent performance. However, the exploration on the p-type TFT is far beyond mature, the main obstacles for the rare research of p-type oxide are as follows: (1) there have been no efficient methods to synthesize high-quality p-type MOS; (2) the choices for p-channel MOS are limited, to the best of our knowledge, only CuxO [3,4] , SnO [5,6] , NiO [7] , CuMO2 (M = Al, Ga, or Cr) [8][9][10] and their mixtures [11,12] or laminates [13] have been reported to exhibit p-type conductivity.…”
Section: Introductionmentioning
confidence: 99%
“…49 Nevertheless, the main reason for using multi-components in the oxide system is to achieve a stable M-O network and to realize the high performance of amorphous metal oxide TFTs. [45][46][47][48][49] To develop oxide-based complementary metal-oxide-semiconductor (CMOS) circuits, high eld-effect mobility (m FE ) of ptype semiconductors is necessary. In a p-type MO semiconductor, the carrier conduction path is formed by anisotropic, localized O 2p orbitals in the valence band, leading to a large hole effective mass and low hole mobility (m h ).…”
Section: Introductionmentioning
confidence: 99%
“… 49 Nevertheless, the main reason for using multi-components in the oxide system is to achieve a stable M–O network and to realize the high performance of amorphous metal oxide TFTs. 45–49 …”
Section: Introductionmentioning
confidence: 99%