2021
DOI: 10.1002/adma.202106923
|View full text |Cite
|
Sign up to set email alerts
|

High‐Performance Harsh‐Environment‐Resistant GaOX Solar‐Blind Photodetectors via Defect and Doping Engineering

Abstract: photodetector (SBPD), as an indispensable part of spectral detectors, plays important roles distinctively in various crucial applications, such as missile tracking, flame prewarning, secure communication, and environment monitoring. [1][2][3][4] In terms of the possible harsh application environment, high-performance SBPDs with excellent tolerance towards high temperature, high voltage, and high radiation, are required inevitably. Based on low cost and mature technology, the currently available Si-based SBPDs … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2

Citation Types

2
58
0
1

Year Published

2022
2022
2024
2024

Publication Types

Select...
8

Relationship

1
7

Authors

Journals

citations
Cited by 99 publications
(61 citation statements)
references
References 62 publications
2
58
0
1
Order By: Relevance
“…Although no peaks appeared in the Raman and XRD spectra of the S350 film, FTIR spectra in Figure S1d (Supporting Information) further ruled out the presence of GaOOH, identifying that the S350 film had totally converted to amorphous Ga 2 O 3 assisted by its XRD spectra results in Figure 2b. [38,39] In spite of the similar element ratios of S350 and S900 (Figure S2, Supporting Information), the following phenomena further support the crystallization process of Ga 2 O 3 in the S900 film during 900 °C annealing, including i) reduction of oxygen vacancies reflected by the decreased ratio of O II /(O I +O II ) (Figure 2c), [24,40] ii) enhancement of intrinsic ultraviolet emission caused by the recombination of free electrons and self-trapped holes, iii) suppression of visible-light (blue and green) emission attributed to the excitation of vacancy and interstitial defects of both oxygen and gallium (Figure 2d), [41,42] and iv) inhibition of carrier lifetime possibly due to the diminished defect-induced traps (Figure 2e). [43,44] These results solidly demonstrate that the printed Ga 2 O 3 film obtains higher crystallinity and the intrinsic defects are significantly reduced during the annealing process.…”
Section: Resultsmentioning
confidence: 78%
See 2 more Smart Citations
“…Although no peaks appeared in the Raman and XRD spectra of the S350 film, FTIR spectra in Figure S1d (Supporting Information) further ruled out the presence of GaOOH, identifying that the S350 film had totally converted to amorphous Ga 2 O 3 assisted by its XRD spectra results in Figure 2b. [38,39] In spite of the similar element ratios of S350 and S900 (Figure S2, Supporting Information), the following phenomena further support the crystallization process of Ga 2 O 3 in the S900 film during 900 °C annealing, including i) reduction of oxygen vacancies reflected by the decreased ratio of O II /(O I +O II ) (Figure 2c), [24,40] ii) enhancement of intrinsic ultraviolet emission caused by the recombination of free electrons and self-trapped holes, iii) suppression of visible-light (blue and green) emission attributed to the excitation of vacancy and interstitial defects of both oxygen and gallium (Figure 2d), [41,42] and iv) inhibition of carrier lifetime possibly due to the diminished defect-induced traps (Figure 2e). [43,44] These results solidly demonstrate that the printed Ga 2 O 3 film obtains higher crystallinity and the intrinsic defects are significantly reduced during the annealing process.…”
Section: Resultsmentioning
confidence: 78%
“…Compared with the control devices (S org 900 in Figure S3, Supporting Information and S350 in Figure S4, Supporting Information), the suppressed I dark of the S900 device can be attributed to the enlarged resistance of the Ga 2 O 3 films caused by recrystallization and the possible N-doping compensation during 900 °C annealing. [24] The I photo multiplication of the S900 device is possibly due to the large internal gain caused by abundant self-trapped holes in the annealing-optimized films.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…[ 3 , 4 , 5 ] Compared to photodiodes, phototransistors based on organic, inorganic, and organic–inorganic hybrid semiconductor materials demonstrate unique advantages of low noise, high sensitivity, and signal‐amplification function, [ 6 , 7 , 8 , 9 , 10 , 11 , 12 ] which have been drawing great research interest in solar‐blind photodetectors. [ 13 , 14 , 15 , 16 , 17 ] Among them, organic semiconductors, which possess low cost, mechanical flexibility, controllable molecular structure, and tunable optoelectronic properties, [ 18 , 19 , 20 , 21 , 22 , 23 ] would render potential applications in flexible and wearable photo response electronic devices. [ 24 , 25 , 26 , 27 , 28 , 29 ] Recently, significant improvements have been achieved in high performance organic solar‐blind photodetectors, either by interface engineering or by developing novel device architectures, and so on.…”
Section: Introductionmentioning
confidence: 99%
“…
Over the past decades, UWBG semiconductors employed in (opto)electronics are dominated by the traditional bulk materials, which have been extensively investigated and widely commercialized, such as Ga 2 O 3 , [1][2][3][4] diamond, [5][6][7] Mg x Zn 1-x O, [8] indium tin oxide (ITO), [9] indium gallium zinc oxide (IGZO), [10] III-nitride (GaN, AlN, Al x Ga 1-x N). [11] Furthermore, various methods have been used to improve devices performance via extensive research efforts, such as localized surface plasmon, [12,13] bandgap engineering, [14,15] array, [16][17][18] heterojunction. [19][20][21][22][23] However, in the post-Moore era, the traditional UWBG semiconductor devices with large size, high power and high cost cannot meet the future requirements of high-performance (opto)electronic devices.
…”
mentioning
confidence: 99%