2006 1st International Symposium on Systems and Control in Aerospace and Astronautics
DOI: 10.1109/isscaa.2006.1627644
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High-Performance Fault-Tolerant CORDIC Processor for Space Applications

Abstract: For space applications, high performance and codes are a very suitable fault tolerant technique to satisfy high reliability are two indicators that become more and the error detecting requirements at a low cost. In the end, an more important to a processor. After an analysis of the implemental result of CORDIC processor for special space different architectures and fault tolerant techniques, an applications is given. implementation of CORDIC processor employing 3N codes for error detection in a 3 granularly pi… Show more

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Cited by 5 publications
(2 citation statements)
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“…However, FPGA-based CORDIC processors are susceptible to various factors such as aging, environmental conditions, and manufacturing defects, leading to the occurrence of faults [5]. Especially as the features shrink in size, the microelectronic devices and circuits become more sensitive to space radiation [6]. Faults can result in performance degradation, computational errors, and system failures [7][8][9].…”
Section: Introductionmentioning
confidence: 99%
“…However, FPGA-based CORDIC processors are susceptible to various factors such as aging, environmental conditions, and manufacturing defects, leading to the occurrence of faults [5]. Especially as the features shrink in size, the microelectronic devices and circuits become more sensitive to space radiation [6]. Faults can result in performance degradation, computational errors, and system failures [7][8][9].…”
Section: Introductionmentioning
confidence: 99%
“…For example, the avionics on-board aerospace craft or satellites often suffer a very harsh radiation environment, where the energetic particles such as protons and ions can cause them invalid. Especially as the features shrink in size, the microelectronic devices and circuits become more sensitive to space radiation [34]. The ionizing radiation origins may send charged particles through transistor junction regions, which will cause changes in sensitive areas such as the memory or logic region of devices [35,36].…”
Section: Introductionmentioning
confidence: 99%