2014
DOI: 10.1364/oe.22.025550
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High-NA fiber point-diffraction interferometer for three-dimensional coordinate measurement

Abstract: The numerical aperture (NA) and power of diffraction wave in point-diffraction interferometer (PDI) could significantly limit the measurement range of the system. A fiber point-diffraction interferometer with high NA is proposed for the measurement of absolute three-dimensional coordinates. Based on the single-mode fiber with submicron aperture, the diffraction wave with both high NA and high power is obtained, by which the achievable measurement range of the PDI can be extended. A double-iterative method base… Show more

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Cited by 24 publications
(24 citation statements)
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“…A PDI system with two optical fibers as point-diffraction sources was developed for full use of the diffracted wavefront [18], in which the diffracted wave from one fiber serves as reference wavefront and that from the other fiber as test wave. Besides, a novel submicron-aperture (SMA) fiber with cone-shaped exit end, as shown in Figure 4(b), has been proposed to obtain both the high diffraction light power and high-NA spherical wavefront [19][20][21]. The SMA fiber taper surface is coated with metallic film and the exit aperture is formed from the polished tip, it is formed with the same processing technology as manufacturing of fiber-based probes for the scanning near-field optical microscopy.…”
Section: Optical Interferometrymentioning
confidence: 99%
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“…A PDI system with two optical fibers as point-diffraction sources was developed for full use of the diffracted wavefront [18], in which the diffracted wave from one fiber serves as reference wavefront and that from the other fiber as test wave. Besides, a novel submicron-aperture (SMA) fiber with cone-shaped exit end, as shown in Figure 4(b), has been proposed to obtain both the high diffraction light power and high-NA spherical wavefront [19][20][21]. The SMA fiber taper surface is coated with metallic film and the exit aperture is formed from the polished tip, it is formed with the same processing technology as manufacturing of fiber-based probes for the scanning near-field optical microscopy.…”
Section: Optical Interferometrymentioning
confidence: 99%
“…The SMA fiber taper surface is coated with metallic film and the exit aperture is formed from the polished tip, it is formed with the same processing technology as manufacturing of fiber-based probes for the scanning near-field optical microscopy. With the SMA fiber, the measurable range can be almost extended to a half space, and the corresponding light transmittance over 50% is obtained [20]. Thus, it is considered as a feasible way to extend the measurement range of the system.…”
Section: Optical Interferometrymentioning
confidence: 99%
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