High moment FeRhN/NiFe laminated thin films for write head applications

Abstract

FeRhN(∼50 nm)/NiFe(∼5 nm) laminated thin films were deposited by dc magnetron sputtering. Upon optimizing the sputtering conditions, FeRhN/NiFe laminated thin films showed good soft magnetic properties, and a well defined uniaxial anisotropy: Bs∼20.3 kG, Hc<1.0 Oe, Hk∼5 Oe. It was shown that a NiFe underlayer improved the soft magnetic properties of a FeRhN layer more effectively than a NiFe top layer. The data obtained by x-ray diffraction study showed that the FeRhN film with a NiFe underlayer had a much stronger (110) texture, as compared to single layer FeRhN film. Columnar grain structure with size of about 10 nm was observed in FeRhN films by high resolution transmission electron microscope. It is believed that the modification of FeRhN microstructure by NiFe underlayer plays a more important role in improving the soft magnetic properties than the exchange coupling between the FeRhN and NiFe layers.

Advanced probe head for perpendicular recording

“…It is recessed from the ABS to provide efficient flux conduction to the probe (P3), so that large on-track field and sharp field gradients can be achieved while maintaining minimal off-track field during recording. The probe head is made of a thin layer of material having a saturation moment as high as 2.35 T [8]. It is deposited on top of the yoke layer and is exposed to the ABS for writing.…”

Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films

“…As promising thin film write head candidates for ultra-high density/data-rate magnetic recording, iron-based nitride multilayers [1][2][3][4] and sandwich structures [5][6][7] have attracted much attention recently. In our previous work [8] we have observed that, the direction of easy axis switches 90º when the film is thick enough in single-layered FeTaN films, and have seen an evolution of in-plane magnetic anisotropy in [FeTaN/TaN] n multilayers.…”