“…After the in-depth structural characterization, we studied the transport properties of the fabricated SLs employing ion gel-gated field-effect transistors (IGFET). This technique relies on the use of the electrical double layer (EDL) to accumulate a high charge carrier density in the film (above 10 14 cm –2 in optimal conditions). ,− In this way, allowing to fill a considerable amount of trap states in the CQD solid, it is possible to measure the close-to intrinsic transport properties of the SLs. , The problem of trap density is highly relevant especially for lead chalcogenide CQD SLs as evidenced by the moderate mobilities that can be achieved in solid-state gated transistors. ,, In recent years, the use of EDL to gate SL transistors has enabled the understanding of the full potential of both PbS , and PbSe assemblies. ,, As mentioned earlier, in a recent work, we demonstrated electron mobilities up to 270 cm 2 V –1 s –1 in three-dimensional PbSe CQD superlattices, owing to the much-improved ordering of these structures with respect to the 2D ones . Encouraged by this result, we set out to study the transport properties of PbS superlattices, which show high coherence lengths in both IP and OP directions.…”