2002
DOI: 10.1002/sia.1200
|View full text |Cite
|
Sign up to set email alerts
|

High‐mass‐resolution ToF‐SIMS study of chlorine‐containing polymers

Abstract: A series of seven chlorine-containing polymers with widely ranging structures have been studied by time-of-flight secondary ion mass spectrometry (ToF-SIMS) at high mass resolution. The prototypical positive ion spectrum of poly(vinyl chloride) has been analysed in detail to identify unambiguously all the components at each nominal mass up to m/z 130. For other polymers based on variously Cl-substituted aliphatic hydrocarbons, the same Cl-containing ions are observed but their relative intensities are differen… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
11
0

Year Published

2002
2002
2016
2016

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 13 publications
(11 citation statements)
references
References 13 publications
0
11
0
Order By: Relevance
“…This is consistent with recent results from a study of chlorine-containing hydrocarbon polymers. 23 A factor that needs to be taken into account in such comparisons is the relative sampling depth of XPS and ToF-SIMS. From studies of the effect of polyelectrolyte thin films on silicon, Delcorte et al 24 concluded that for atomic species (Si C from the substrate) the two techniques had comparable sampling depths when XPS measurements were made at a take-off angle of 15°(with respect to the surface).…”
Section: Discussionmentioning
confidence: 99%
“…This is consistent with recent results from a study of chlorine-containing hydrocarbon polymers. 23 A factor that needs to be taken into account in such comparisons is the relative sampling depth of XPS and ToF-SIMS. From studies of the effect of polyelectrolyte thin films on silicon, Delcorte et al 24 concluded that for atomic species (Si C from the substrate) the two techniques had comparable sampling depths when XPS measurements were made at a take-off angle of 15°(with respect to the surface).…”
Section: Discussionmentioning
confidence: 99%
“…Automated surface analysis of large sample sets has been achieved for water contact angle measurements, X‐ray photoelectron spectroscopy, atomic force microscopy, surface plasmon resonance and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) . ToF‐SIMS has been widely used for studying polymeric systems, and when coupled with multivariate analysis has proven to be particularly useful for establishing correlations between the surface chemistries of a library of materials with various properties such as water contact angle and cell attachment . Whilst these correlations eloquently demonstrate a relationship between surface chemistry and the interfacial performance of the materials, the models themselves are difficult to interpret as they typically feature an abundance of small ion fragments that are derived from multiple, if not all, materials present in a study and are thus difficult to assign to specific chemical functionalities or properties.…”
Section: Introductionmentioning
confidence: 99%
“…The work of Briggs et al (2002) is useful in interpretation of spectra. They conducted TOF SIMS analyses on poly(vinyl chloride) polymers.…”
Section: Mass Fragment Fingerprints Of Microfracture Surfacesmentioning
confidence: 99%